TY - JOUR
T1 - Exchange biases of Co, Py, Co40Fe40B20, Co75Fe25, and Co50Fe50 on epitaxial BiFeO3 films prepared by chemical solution deposition
AU - Naganuma, Hiroshi
AU - Ogane, Mikihiko
AU - Ando, Yasuo
PY - 2011/4/1
Y1 - 2011/4/1
N2 - Multiferroic BiFeO3 epitaxial films were fabricated on SrTiO3 (100) substrates by a chemical solution deposition method. Magnetic layers of Co, Py, Co40Fe40B20, Co 75Fe25, and Co50Fe50 were then deposited by sputtering under a magnetic field. Despite employing a chemical process, a clear exchange bias was observed for all the magnetic materials. The temperature dependence of Hex was evaluated for a Co 50Fe50/BiFeO3 bilayer having a relatively large Hex and high squareness. The Hex of Co 50Fe50/BiFeO3 bilayer increased between 10 to 250 K.
AB - Multiferroic BiFeO3 epitaxial films were fabricated on SrTiO3 (100) substrates by a chemical solution deposition method. Magnetic layers of Co, Py, Co40Fe40B20, Co 75Fe25, and Co50Fe50 were then deposited by sputtering under a magnetic field. Despite employing a chemical process, a clear exchange bias was observed for all the magnetic materials. The temperature dependence of Hex was evaluated for a Co 50Fe50/BiFeO3 bilayer having a relatively large Hex and high squareness. The Hex of Co 50Fe50/BiFeO3 bilayer increased between 10 to 250 K.
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U2 - 10.1063/1.3563061
DO - 10.1063/1.3563061
M3 - Article
AN - SCOPUS:79955395895
VL - 109
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 7
M1 - 07D736
ER -