Excellent reliability of CoFe-IrMn spin valves

H. Iwasaki, A. T. Saito, A. Tsutai, Masashi Sahashi

Research output: Contribution to journalArticlepeer-review

23 Citations (Scopus)

Abstract

The thermal reliability of spin valve films with a CoZrNb/NiFe/CoFe free layer and a CoFe/IrMn pinned layer was investigated. Stable properties; including an MR ratio of 7. 5~8 %, an exchange bias of 400~500 Oe in the pinned layer, an interlayer coupling of less than 10 Oe between the pinned and free layers, and soft magnetic properties of the free layer, were observed even after annealing for 100 hours at 270 C. It was demonstrated that the IrMn/CoFe interface, as well as the CoFe/Gu interface, is extremely stable against interdiffusion. These films also showed an MR ratio of 5 % and an exchange bias of 200 Oe even at 160 C.

Original languageEnglish
Pages (from-to)2875-2877
Number of pages3
JournalIEEE Transactions on Magnetics
Volume33
Issue number5 PART 1
DOIs
Publication statusPublished - 1997 Dec 1
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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