Abstract
As reported previously the tip current of a scanning tunneling microscope (STM) is excited by irradiation of x-rays on the sample. This x-ray-excited STM tip current originates from electrons emitted from the sample surface. We measured the STM tip current excited by synchrotron radiation for Au-Ni thin-film samples as the x-ray energy was scanned near the Au L III and Ni K absorption edges. It was found that the STM tip current increased at the x-ray energy near the absorption edge and extended x-ray adsorption fine structure (EXAFS)-like and x-ray adsorption near-edge structure (XANES)-like spectra were obtained. The experimental result using the tip coated with insulator suggested that the analysing area was approx. 1.0 mm in diameter.
| Original language | English |
|---|---|
| Pages (from-to) | 132-135 |
| Number of pages | 4 |
| Journal | Surface and Interface Analysis |
| Volume | 27 |
| Issue number | 3 |
| Publication status | Published - 1999 Dec 1 |
ASJC Scopus subject areas
- Chemistry(all)
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry