EXAFS- and XANES-like spectra obtained by x-ray-excited scanning tunneling microscope tip current measurement

Kouichi Tsuji; Kazuaki Wagatsuma; Kazuaki Sugiyama; Kenji Hiraga; Yoshio Waseda

EXAFS- and XANES-like spectra obtained by x-ray-excited scanning tunneling microscope tip current measurement

Kouichi Tsuji, Kazuaki Wagatsuma, Kazuaki Sugiyama, Kenji Hiraga, Yoshio Waseda

Research output: Contribution to journal › Article › peer-review

Abstract

As reported previously the tip current of a scanning tunneling microscope (STM) is excited by irradiation of x-rays on the sample. This x-ray-excited STM tip current originates from electrons emitted from the sample surface. We measured the STM tip current excited by synchrotron radiation for Au-Ni thin-film samples as the x-ray energy was scanned near the Au L III and Ni K absorption edges. It was found that the STM tip current increased at the x-ray energy near the absorption edge and extended x-ray adsorption fine structure (EXAFS)-like and x-ray adsorption near-edge structure (XANES)-like spectra were obtained. The experimental result using the tip coated with insulator suggested that the analysing area was approx. 1.0 mm in diameter.

Original language	English
Pages (from-to)	132-135
Number of pages	4
Journal	Surface and Interface Analysis
Volume	27
Issue number	3
Publication status	Published - 1999 Dec 1

ASJC Scopus subject areas

Chemistry(all)
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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title = "EXAFS- and XANES-like spectra obtained by x-ray-excited scanning tunneling microscope tip current measurement",

abstract = "As reported previously the tip current of a scanning tunneling microscope (STM) is excited by irradiation of x-rays on the sample. This x-ray-excited STM tip current originates from electrons emitted from the sample surface. We measured the STM tip current excited by synchrotron radiation for Au-Ni thin-film samples as the x-ray energy was scanned near the Au L III and Ni K absorption edges. It was found that the STM tip current increased at the x-ray energy near the absorption edge and extended x-ray adsorption fine structure (EXAFS)-like and x-ray adsorption near-edge structure (XANES)-like spectra were obtained. The experimental result using the tip coated with insulator suggested that the analysing area was approx. 1.0 mm in diameter.",

author = "Kouichi Tsuji and Kazuaki Wagatsuma and Kazuaki Sugiyama and Kenji Hiraga and Yoshio Waseda",

year = "1999",

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journal = "Surface and Interface Analysis",

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TY - JOUR

T1 - EXAFS- and XANES-like spectra obtained by x-ray-excited scanning tunneling microscope tip current measurement

AU - Tsuji, Kouichi

AU - Wagatsuma, Kazuaki

AU - Sugiyama, Kazuaki

AU - Hiraga, Kenji

AU - Waseda, Yoshio

PY - 1999/12/1

Y1 - 1999/12/1

N2 - As reported previously the tip current of a scanning tunneling microscope (STM) is excited by irradiation of x-rays on the sample. This x-ray-excited STM tip current originates from electrons emitted from the sample surface. We measured the STM tip current excited by synchrotron radiation for Au-Ni thin-film samples as the x-ray energy was scanned near the Au L III and Ni K absorption edges. It was found that the STM tip current increased at the x-ray energy near the absorption edge and extended x-ray adsorption fine structure (EXAFS)-like and x-ray adsorption near-edge structure (XANES)-like spectra were obtained. The experimental result using the tip coated with insulator suggested that the analysing area was approx. 1.0 mm in diameter.

AB - As reported previously the tip current of a scanning tunneling microscope (STM) is excited by irradiation of x-rays on the sample. This x-ray-excited STM tip current originates from electrons emitted from the sample surface. We measured the STM tip current excited by synchrotron radiation for Au-Ni thin-film samples as the x-ray energy was scanned near the Au L III and Ni K absorption edges. It was found that the STM tip current increased at the x-ray energy near the absorption edge and extended x-ray adsorption fine structure (EXAFS)-like and x-ray adsorption near-edge structure (XANES)-like spectra were obtained. The experimental result using the tip coated with insulator suggested that the analysing area was approx. 1.0 mm in diameter.

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