Evaluation of Thermal Diffuse Electron Scattering in Au with the Imaging Plate

Takashi Ohishi, Daisuke Shindo, Kenji Hiraga, Jun ichi Kudoh

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

By using the imaging plate, electron diffraction patterns of an Au thin film were observed quantitatively by changing the temperature. Intensity of both Bragg reflections and the background in the electron diffraction patterns contributed from thermal diffuse scattering as well as plasmon scattering were measured accurately. It was shown that the background contributed from the thermal diffuse scattering in the electron diffraction patterns increased monotonously with the increase of temperature. The change in the observed intensity of the thermal diffuse scattering with the change in temperature was briefly discussed in terms of a theoretical model.

Original languageEnglish
Pages (from-to)686-688
Number of pages3
JournalMaterials Transactions, JIM
Volume36
Issue number5
DOIs
Publication statusPublished - 1995

Keywords

  • electron diffraction pattern
  • imaging plate
  • in-situ observation
  • quantitative analysis
  • thermal diffuse scattering

ASJC Scopus subject areas

  • Engineering(all)

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