Evaluation of the 1040x1040 PtSi CSD for astronomical use

Kenshi Yanagisawa, Nobunari Itoh, Takashi Ichikawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

We present the performance of the 1040 by 1040 PtSi CSD manufactured by Mitsubishi Electric Co. for an application of astronomical imaging. The sensor was evaluated both in laboratory and in real observing conditions. The results of noise, quantum efficiency, linearity, dark current and photometric accuracy are presented.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsBjorn F. Andresen, Marija S. Scholl
Pages92-103
Number of pages12
Volume2744
Publication statusPublished - 1996 Jan 1
EventInfrared Technology and Applications XXII - Orlando, FL, USA
Duration: 1996 Apr 81996 Apr 12

Other

OtherInfrared Technology and Applications XXII
CityOrlando, FL, USA
Period96/4/896/4/12

ASJC Scopus subject areas

  • Engineering(all)

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