Evaluation of in-vacuum imaging plate detector for X-ray diffraction microscopy

Yoshinori Nishino, Yukio Takahashi, Masaki Yamamoto, Tetsuya Ishikawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We performed evaluation tests of a newly developed in-vacuum imaging plate (IP) detector for x-ray diffraction microscopy. IP detectors have advantages over direct x-ray detection charge-coupled device (CCD) detectors, which have been commonly used in x-ray diffraction microscopy experiments, in the capabilities for a high photon count and for a wide area. The detector system contains two IPs to make measurement efficient by recording data with the one while reading or erasing the other. We compared speckled diffraction patterns of single particles taken with the IP and a direct x-ray detection CCD. The IP was inferior to the CCD in spatial resolution and in signal-to-noise ratio at a low photon count.

Original languageEnglish
Title of host publicationSYNCHROTRON RADIATION INSTRUMENTATION
Subtitle of host publicationNinth International Conference on Synchrotron Radiation Instrumentation
Pages1376-1379
Number of pages4
DOIs
Publication statusPublished - 2007 Mar 26
Externally publishedYes
EventSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of
Duration: 2006 May 282006 Jun 28

Publication series

NameAIP Conference Proceedings
Volume879
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
CountryKorea, Republic of
CityDaegu
Period06/5/2806/6/28

Keywords

  • Coherent X-rays
  • Imaging plate
  • Speckle
  • X-ray diffraction microscopy

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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