@inproceedings{32f8154fdfd24628a0db0f73a768db75,
title = "Evaluation of in-vacuum imaging plate detector for X-ray diffraction microscopy",
abstract = "We performed evaluation tests of a newly developed in-vacuum imaging plate (IP) detector for x-ray diffraction microscopy. IP detectors have advantages over direct x-ray detection charge-coupled device (CCD) detectors, which have been commonly used in x-ray diffraction microscopy experiments, in the capabilities for a high photon count and for a wide area. The detector system contains two IPs to make measurement efficient by recording data with the one while reading or erasing the other. We compared speckled diffraction patterns of single particles taken with the IP and a direct x-ray detection CCD. The IP was inferior to the CCD in spatial resolution and in signal-to-noise ratio at a low photon count.",
keywords = "Coherent X-rays, Imaging plate, Speckle, X-ray diffraction microscopy",
author = "Yoshinori Nishino and Yukio Takahashi and Masaki Yamamoto and Tetsuya Ishikawa",
year = "2007",
month = mar,
day = "26",
doi = "10.1063/1.2436321",
language = "English",
isbn = "0735403732",
series = "AIP Conference Proceedings",
pages = "1376--1379",
booktitle = "SYNCHROTRON RADIATION INSTRUMENTATION",
note = "SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation ; Conference date: 28-05-2006 Through 28-06-2006",
}