Evaluation of electrical properties of leaky BiFeO3 films in high electric field region by high-speed positive-up-negative-down measurement

Hiroshi Naganuma, Yosuke Inoue, Soichiro Okamura

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Abstract

The electrical properties of leaky ferroelectric BiFeO3 thin films were evaluated by using a high-speed positive-up-negative-down (PUND) measurement technique. The leakage current density was estimated from the gradient of the pulse response when a constant electric field was applied. The relative permittivity was estimated from an abrupt decrement when the applied field was removed. The twofold remanent polarization without the influence of the leakage current was estimated by subtracting the contribution of a paraelectric component from the abrupt Increment In the pulse response when a positive pulse was applied.

Original languageEnglish
Pages (from-to)616011-616013
Number of pages3
JournalApplied Physics Express
Volume1
Issue number6
DOIs
Publication statusPublished - 2008 Jun 1
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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