Evaluation of damage in DNA molecules resulting from very-low-frequency magnetic fields by using bacterial mutation repairing genetic system

Akira Igarashi, Koichiro Kobayashi, Hidetoshi Matsuki, Ginro Endo, Akira Haga

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

The effect of very-low-frequency magnetic fields (VLFMF) on living biological cells was investigated using a highly sensitive mutagenesis assay method. A bacterial gene expression system for mutation repair (umu system) was used for the sensitive evaluation of damage in DNA molecules. Salmonella typhimurium TA1535/pSK1002 were exposed to VLFMF (20 kHz, 600 μT, and 60 kHz, 100 μT) in a specially designed magnetic field exposure chamber. The experimental results showed the possibility of applying the umu assay for sensitive and effective evaluation of damage in DNA molecules. No significant difference was observed in the umu gene expression intensity under exposure to magnetic field of 20 kHz, 600 μT, and 60 kHz, 100 μT.

Original languageEnglish
Pages (from-to)4368-4370
Number of pages3
JournalIEEE Transactions on Magnetics
Volume41
Issue number11
DOIs
Publication statusPublished - 2005 Nov

Keywords

  • Mutation repairing gene
  • Salmonella typhimurium TA1535/pSK1002
  • Very-low-frequency magnetic field (VLFMF)
  • umu assay
  • β-galactosidase

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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