Evaluation of a Flat-Field Grazing Incidence Spectrometer for Highly Charged Ion Plasma Emission in 1–10 nm

Y. Kondo, T. H. Dinh, T. Tamura, S. Ohta, K. Kitano, T. Ejima, T. Hatano, T. Higashiguchi

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

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    Physics & Astronomy