Evaluation of a Flat-Field Grazing Incidence Spectrometer for Highly Charged Ion Plasma Emission in 1–10 nm

Y. Kondo, T. H. Dinh, T. Tamura, S. Ohta, K. Kitano, T. Ejima, T. Hatano, T. Higashiguchi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A flat-field grazing incident spectrometer was built to investigate highly charged ion (HCI) plasmas in the spectral region from 1 to 10 nm. The spectrometer consists of a flat-filed grating with 2400 lines/mm as a dispersing element and an X-ray charged-coupled device (CCD) camera as the detector. In order to produce accurate intensity calibrated spectra of the HCI plasmas, the diffraction efficiency of the grating and the sensitivity of the CCD camera were directly measured by using the reflectometer installed at the BL-11D of the Photon Factory (PF). We also studied the calibrated spectra of Gd HCI plasmas which were produced by an Nd:YAG laser.

Original languageEnglish
Title of host publicationX-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers
EditorsTetsuya Kawachi, Sergei V. Bulanov, Hiroyuki Daido, Yoshiaki Kato
PublisherSpringer Science and Business Media, LLC
Pages409-412
Number of pages4
ISBN (Print)9783319730240
DOIs
Publication statusPublished - 2018
Event15th International Conference on X-Ray Lasers, ICXRL 2016 - Nara, Japan
Duration: 2016 May 222016 May 27

Publication series

NameSpringer Proceedings in Physics
Volume202
ISSN (Print)0930-8989
ISSN (Electronic)1867-4941

Other

Other15th International Conference on X-Ray Lasers, ICXRL 2016
CountryJapan
CityNara
Period16/5/2216/5/27

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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