Evaluation of a Flat-Field Grazing Incidence Spectrometer for Highly Charged Ion Plasma Emission in 1–10 nm

Y. Kondo, T. H. Dinh, T. Tamura, S. Ohta, K. Kitano, T. Ejima, T. Hatano, T. Higashiguchi

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    A flat-field grazing incident spectrometer was built to investigate highly charged ion (HCI) plasmas in the spectral region from 1 to 10 nm. The spectrometer consists of a flat-filed grating with 2400 lines/mm as a dispersing element and an X-ray charged-coupled device (CCD) camera as the detector. In order to produce accurate intensity calibrated spectra of the HCI plasmas, the diffraction efficiency of the grating and the sensitivity of the CCD camera were directly measured by using the reflectometer installed at the BL-11D of the Photon Factory (PF). We also studied the calibrated spectra of Gd HCI plasmas which were produced by an Nd:YAG laser.

    Original languageEnglish
    Title of host publicationX-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers
    EditorsTetsuya Kawachi, Sergei V. Bulanov, Hiroyuki Daido, Yoshiaki Kato
    PublisherSpringer Science and Business Media, LLC
    Pages409-412
    Number of pages4
    ISBN (Print)9783319730240
    DOIs
    Publication statusPublished - 2018
    Event15th International Conference on X-Ray Lasers, ICXRL 2016 - Nara, Japan
    Duration: 2016 May 222016 May 27

    Publication series

    NameSpringer Proceedings in Physics
    Volume202
    ISSN (Print)0930-8989
    ISSN (Electronic)1867-4941

    Other

    Other15th International Conference on X-Ray Lasers, ICXRL 2016
    Country/TerritoryJapan
    CityNara
    Period16/5/2216/5/27

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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