Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm

Thanh Hung Dinh, Yoshiki Kondo, Toshiki Tamura, Yuichi Ono, Hiroyuki Hara, Hiroki Oikawa, Yoichi Yamamoto, Masahiko Ishino, Masaharu Nishikino, Tetsuya Makimura, Padraig Dunne, Gerry O'Sullivan, Shigeru Ohta, Ken Kitano, Takeo Ejima, Hatano Tadashi, Takeshi Higashiguchi

    Research output: Contribution to journalArticlepeer-review

    17 Citations (Scopus)

    Abstract

    A flat-field grazing incidence spectrometer operating on the spectral region from 1 to 10 nm was built for research on physics of high temperature and high energy density plasmas. It consists of a flat-field grating with 2400 lines/mm as a dispersing element and an x-ray charged coupled device (CCD) camera as the detector. The diffraction efficiency of the grating and the sensitivity of the CCD camera were directly measured by use of synchrotron radiation at the BL-11D beamline of the Photon Factory (PF). The influence of contamination to the spectrometer also was characterized. This result enables us to evaluate the absolute number of photons in a wide range wavelength between 1 and 10 nm within an acquisition. We obtained absolutely calibrated spectra from highly charged ion plasmas of Gd, from which a maximum energy conversion efficiency of 0.26% was observed at a Nd:YAG laser intensity of 3 × 1012 W/cm2.

    Original languageEnglish
    Article number123106
    JournalReview of Scientific Instruments
    Volume87
    Issue number12
    DOIs
    Publication statusPublished - 2016 Dec 1

    ASJC Scopus subject areas

    • Instrumentation

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