TY - GEN
T1 - Etch rate dependence on crystal orientation for lithium niobate
AU - Randles, Andrew B.
AU - Tanaka, Shuji
AU - Esashi, Masayoshi
PY - 2007/12/1
Y1 - 2007/12/1
N2 - This paper presents experimental data for the etch rate of lithium niobate (LiNbO3) as a function of crystal orientation. The etching characterization is a fundamental technology needed for the fabrication of new sensors, actuators or other new devices. In this study, 30 mm spheres of LiNbO3 were etched in hydrofluoric acid and in a solution of hydrofluoric and nitric acids, to determine the etch rate dependence on crystal orientation. It was found that the maximum etch rate was on the -Z face and the etching showed a three-fold symmetry about the Z axis. The Wulff-Jaccodine method as well as the data collected from the etched spheres were used to predict the etched shape of a wafer. The predicted shape agreed with that found during etching.
AB - This paper presents experimental data for the etch rate of lithium niobate (LiNbO3) as a function of crystal orientation. The etching characterization is a fundamental technology needed for the fabrication of new sensors, actuators or other new devices. In this study, 30 mm spheres of LiNbO3 were etched in hydrofluoric acid and in a solution of hydrofluoric and nitric acids, to determine the etch rate dependence on crystal orientation. It was found that the maximum etch rate was on the -Z face and the etching showed a three-fold symmetry about the Z axis. The Wulff-Jaccodine method as well as the data collected from the etched spheres were used to predict the etched shape of a wafer. The predicted shape agreed with that found during etching.
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U2 - 10.1109/ULTSYM.2007.533
DO - 10.1109/ULTSYM.2007.533
M3 - Conference contribution
AN - SCOPUS:48149092752
SN - 1424413834
SN - 9781424413836
T3 - Proceedings - IEEE Ultrasonics Symposium
SP - 2119
EP - 2122
BT - 2007 IEEE Ultrasonics Symposium Proceedings, IUS
T2 - 2007 IEEE Ultrasonics Symposium, IUS
Y2 - 28 October 2007 through 31 October 2007
ER -