Error compensation of single-qubit gates in a surface-electrode ion trap using composite pulses

Emily Mount, Chingiz Kabytayev, Stephen Crain, Robin Harper, So Young Baek, Geert Vrijsen, Steven T. Flammia, Kenneth R. Brown, Peter Maunz, Jungsang Kim

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

The fidelity of laser-driven quantum logic operations on trapped ion qubits tend to be lower than microwave-driven logic operations due to the difficulty of stabilizing the driving fields at the ion location. Through stabilization of the driving optical fields and use of composite pulse sequences, we demonstrate high-fidelity single-qubit gates for the hyperfine qubit of a Yb+171 ion trapped in a microfabricated surface-electrode ion trap. Gate error is characterized using a randomized benchmarking protocol and an average error per randomized Clifford group gate of 3.6(3)×10-4 is measured. We also report experimental realization of palindromic pulse sequences that scale efficiently in sequence length.

Original languageEnglish
Article number060301
JournalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume92
Issue number6
DOIs
Publication statusPublished - 2015 Dec 16
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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    Mount, E., Kabytayev, C., Crain, S., Harper, R., Baek, S. Y., Vrijsen, G., Flammia, S. T., Brown, K. R., Maunz, P., & Kim, J. (2015). Error compensation of single-qubit gates in a surface-electrode ion trap using composite pulses. Physical Review A - Atomic, Molecular, and Optical Physics, 92(6), [060301]. https://doi.org/10.1103/PhysRevA.92.060301