Error compensation of single-qubit gates in a surface-electrode ion trap using composite pulses

Emily Mount; Chingiz Kabytayev; Stephen Crain; Robin Harper; So Young Baek; Geert Vrijsen; Steven T. Flammia; Kenneth R. Brown; Peter Maunz; Jungsang Kim

doi:10.1103/PhysRevA.92.060301

Error compensation of single-qubit gates in a surface-electrode ion trap using composite pulses

Emily Mount, Chingiz Kabytayev, Stephen Crain, Robin Harper, So Young Baek, Geert Vrijsen, Steven T. Flammia, Kenneth R. Brown, Peter Maunz, Jungsang Kim

Research output: Contribution to journal › Article › peer-review

35 Citations (Scopus)

Abstract

The fidelity of laser-driven quantum logic operations on trapped ion qubits tend to be lower than microwave-driven logic operations due to the difficulty of stabilizing the driving fields at the ion location. Through stabilization of the driving optical fields and use of composite pulse sequences, we demonstrate high-fidelity single-qubit gates for the hyperfine qubit of a Yb+171 ion trapped in a microfabricated surface-electrode ion trap. Gate error is characterized using a randomized benchmarking protocol and an average error per randomized Clifford group gate of 3.6(3)×10-4 is measured. We also report experimental realization of palindromic pulse sequences that scale efficiently in sequence length.

Original language	English
Article number	060301
Journal	Physical Review A - Atomic, Molecular, and Optical Physics
Volume	92
Issue number	6
DOIs	https://doi.org/10.1103/PhysRevA.92.060301
Publication status	Published - 2015 Dec 16
Externally published	Yes

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.1103/PhysRevA.92.060301

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abstract = "The fidelity of laser-driven quantum logic operations on trapped ion qubits tend to be lower than microwave-driven logic operations due to the difficulty of stabilizing the driving fields at the ion location. Through stabilization of the driving optical fields and use of composite pulse sequences, we demonstrate high-fidelity single-qubit gates for the hyperfine qubit of a Yb+171 ion trapped in a microfabricated surface-electrode ion trap. Gate error is characterized using a randomized benchmarking protocol and an average error per randomized Clifford group gate of 3.6(3)×10-4 is measured. We also report experimental realization of palindromic pulse sequences that scale efficiently in sequence length.",

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AU - Mount, Emily

AU - Kabytayev, Chingiz

AU - Crain, Stephen

AU - Harper, Robin

AU - Baek, So Young

AU - Vrijsen, Geert

AU - Flammia, Steven T.

AU - Brown, Kenneth R.

AU - Maunz, Peter

AU - Kim, Jungsang

PY - 2015/12/16

Y1 - 2015/12/16

N2 - The fidelity of laser-driven quantum logic operations on trapped ion qubits tend to be lower than microwave-driven logic operations due to the difficulty of stabilizing the driving fields at the ion location. Through stabilization of the driving optical fields and use of composite pulse sequences, we demonstrate high-fidelity single-qubit gates for the hyperfine qubit of a Yb+171 ion trapped in a microfabricated surface-electrode ion trap. Gate error is characterized using a randomized benchmarking protocol and an average error per randomized Clifford group gate of 3.6(3)×10-4 is measured. We also report experimental realization of palindromic pulse sequences that scale efficiently in sequence length.

AB - The fidelity of laser-driven quantum logic operations on trapped ion qubits tend to be lower than microwave-driven logic operations due to the difficulty of stabilizing the driving fields at the ion location. Through stabilization of the driving optical fields and use of composite pulse sequences, we demonstrate high-fidelity single-qubit gates for the hyperfine qubit of a Yb+171 ion trapped in a microfabricated surface-electrode ion trap. Gate error is characterized using a randomized benchmarking protocol and an average error per randomized Clifford group gate of 3.6(3)×10-4 is measured. We also report experimental realization of palindromic pulse sequences that scale efficiently in sequence length.

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Error compensation of single-qubit gates in a surface-electrode ion trap using composite pulses

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