Erratum: Spin Peltier effect and its length scale in Pt/YIG system at high temperatures (Appl. Phys. Express (2022) 15 063002) DOI: 10.35848/1882-0786/ac6fae)

We have found that the position of the sample was slightly shifted at high temperatures due to the thermal expansion of the sample and temperature control stage, and that the analysis of the YIG thickness dependence of the SPE signal was affected. To solve this problem, we estimated the sample shift quantitatively from the shift of the black ink pattern in the steady-state thermal images at each temperature T. Figures 3 and 4 are thus corrected by taking the estimated shift into account, as shown below. The Aodd and fodd images in Figs. 3(a) and 3(b) have been slightly shifted to match the displacement of the sample at each temperature. In the corrected analysis, the YIG/GGG interface, i.e., the position at tYIG = 0 μm, at 314 K was determined to be the position where the SPE signal starts to appear and that at higher temperatures was estimated quantitatively based on the shift of the steady-state thermal images at each T. We have confirmed that the T dependence of the SPE-induced temperature modulation ΔTSPE remains almost unchanged [Fig. 3(c)].