Erratum: Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12  (123106))

Thanh Hung Dinh; Yoshiki Kondo; Toshiki Tamura; Yuichi Ono; Hiroyuki Hara; Hiroki Oikawa; Yoichi Yamamoto; Masahiko Ishino; Masaharu Nishikino; Tetsuya Makimura; Padraig Dunne; Gerry O'Sullivan; Shigeru Ohta; Ken Kitano; Takeo Ejima; Tadashi Hatano; Takeshi Higashiguchi

doi:10.1063/1.4973926

Erratum: Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106))

Thanh Hung Dinh, Yoshiki Kondo, Toshiki Tamura, Yuichi Ono, Hiroyuki Hara, Hiroki Oikawa, Yoichi Yamamoto, Masahiko Ishino, Masaharu Nishikino, Tetsuya Makimura, Padraig Dunne, Gerry O'Sullivan, Shigeru Ohta, Ken Kitano, Takeo Ejima, Tadashi Hatano, Takeshi Higashiguchi

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English
Pages (from-to)	29902
Number of pages	1
Journal	The Review of scientific instruments
Volume	88
Issue number	2
DOIs	https://doi.org/10.1063/1.4973926
Publication status	Published - 2017 Feb 1

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Instrumentation

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10.1063/1.4973926

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Dinh, T. H., Kondo, Y., Tamura, T., Ono, Y., Hara, H., Oikawa, H., Yamamoto, Y., Ishino, M., Nishikino, M., Makimura, T., Dunne, P., O'Sullivan, G., Ohta, S., Kitano, K., Ejima, T., Hatano, T., & Higashiguchi, T. (2017). Erratum: Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106)). The Review of scientific instruments, 88(2), 29902. https://doi.org/10.1063/1.4973926

Erratum : Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106)). / Dinh, Thanh Hung; Kondo, Yoshiki; Tamura, Toshiki; Ono, Yuichi; Hara, Hiroyuki; Oikawa, Hiroki; Yamamoto, Yoichi; Ishino, Masahiko; Nishikino, Masaharu; Makimura, Tetsuya; Dunne, Padraig; O'Sullivan, Gerry; Ohta, Shigeru; Kitano, Ken; Ejima, Takeo ; Hatano, Tadashi; Higashiguchi, Takeshi.

In: The Review of scientific instruments, Vol. 88, No. 2, 01.02.2017, p. 29902.

Research output: Contribution to journal › Comment/debate › peer-review

Dinh, TH, Kondo, Y, Tamura, T, Ono, Y, Hara, H, Oikawa, H, Yamamoto, Y, Ishino, M, Nishikino, M, Makimura, T, Dunne, P, O'Sullivan, G, Ohta, S, Kitano, K, Ejima, T , Hatano, T & Higashiguchi, T 2017, 'Erratum: Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106))', The Review of scientific instruments, vol. 88, no. 2, pp. 29902. https://doi.org/10.1063/1.4973926

Dinh TH, Kondo Y, Tamura T, Ono Y, Hara H, Oikawa H et al. Erratum: Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106)). The Review of scientific instruments. 2017 Feb 1;88(2):29902. https://doi.org/10.1063/1.4973926

Dinh, Thanh Hung ; Kondo, Yoshiki ; Tamura, Toshiki ; Ono, Yuichi ; Hara, Hiroyuki ; Oikawa, Hiroki ; Yamamoto, Yoichi ; Ishino, Masahiko ; Nishikino, Masaharu ; Makimura, Tetsuya ; Dunne, Padraig ; O'Sullivan, Gerry ; Ohta, Shigeru ; Kitano, Ken ; Ejima, Takeo ; Hatano, Tadashi ; Higashiguchi, Takeshi. / Erratum : Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106)). In: The Review of scientific instruments. 2017 ; Vol. 88, No. 2. pp. 29902.

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AU - Ono, Yuichi

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Erratum: Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106))

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