Erratum: Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12  (123106))

Thanh Hung Dinh; Yoshiki Kondo; Toshiki Tamura; Yuichi Ono; Hiroyuki Hara; Hiroki Oikawa; Yoichi Yamamoto; Masahiko Ishino; Masaharu Nishikino; Tetsuya Makimura; Padraig Dunne; Gerry O'Sullivan; Shigeru Ohta; Ken Kitano; Takeo Ejima; Tadashi Hatano; Takeshi Higashiguchi

doi:10.1063/1.4973926

Erratum: Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106))

Thanh Hung Dinh, Yoshiki Kondo, Toshiki Tamura, Yuichi Ono, Hiroyuki Hara, Hiroki Oikawa, Yoichi Yamamoto, Masahiko Ishino, Masaharu Nishikino, Tetsuya Makimura, Padraig Dunne, Gerry O'Sullivan, Shigeru Ohta, Ken Kitano, Takeo Ejima, Tadashi Hatano, Takeshi Higashiguchi

Center for Advanced Microscopy and Spectroscopy

Research output: Contribution to journal › Comment/debate

Original language	English
Number of pages	1
Journal	The Review of scientific instruments
Volume	88
Issue number	2
DOIs	https://doi.org/10.1063/1.4973926
Publication status	Published - 2017 Feb 1

ASJC Scopus subject areas

Instrumentation

Access to Document

10.1063/1.4973926

Cite this

Dinh, T. H., Kondo, Y., Tamura, T., Ono, Y., Hara, H., Oikawa, H., Yamamoto, Y., Ishino, M., Nishikino, M., Makimura, T., Dunne, P., O'Sullivan, G., Ohta, S., Kitano, K., Ejima, T., Hatano, T., & Higashiguchi, T. (2017). Erratum: Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106)). The Review of scientific instruments, 88(2). https://doi.org/10.1063/1.4973926

Erratum : Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106)). / Dinh, Thanh Hung; Kondo, Yoshiki; Tamura, Toshiki; Ono, Yuichi; Hara, Hiroyuki; Oikawa, Hiroki; Yamamoto, Yoichi; Ishino, Masahiko; Nishikino, Masaharu; Makimura, Tetsuya; Dunne, Padraig; O'Sullivan, Gerry; Ohta, Shigeru; Kitano, Ken; Ejima, Takeo ; Hatano, Tadashi; Higashiguchi, Takeshi.

In: The Review of scientific instruments, Vol. 88, No. 2, 01.02.2017.

Research output: Contribution to journal › Comment/debate

Dinh, TH, Kondo, Y, Tamura, T, Ono, Y, Hara, H, Oikawa, H, Yamamoto, Y, Ishino, M, Nishikino, M, Makimura, T, Dunne, P, O'Sullivan, G, Ohta, S, Kitano, K, Ejima, T , Hatano, T & Higashiguchi, T 2017, 'Erratum: Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106))', The Review of scientific instruments, vol. 88, no. 2. https://doi.org/10.1063/1.4973926

Dinh TH, Kondo Y, Tamura T, Ono Y, Hara H, Oikawa H et al. Erratum: Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106)). The Review of scientific instruments. 2017 Feb 1;88(2). https://doi.org/10.1063/1.4973926

Dinh, Thanh Hung ; Kondo, Yoshiki ; Tamura, Toshiki ; Ono, Yuichi ; Hara, Hiroyuki ; Oikawa, Hiroki ; Yamamoto, Yoichi ; Ishino, Masahiko ; Nishikino, Masaharu ; Makimura, Tetsuya ; Dunne, Padraig ; O'Sullivan, Gerry ; Ohta, Shigeru ; Kitano, Ken ; Ejima, Takeo ; Hatano, Tadashi ; Higashiguchi, Takeshi. / Erratum : Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106)). In: The Review of scientific instruments. 2017 ; Vol. 88, No. 2.

@article{0d9ae221048a4525a54c7d4bcb389343,

title = "Erratum: Publisher's Note: {"}Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm{"} [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106))",

author = "Dinh, {Thanh Hung} and Yoshiki Kondo and Toshiki Tamura and Yuichi Ono and Hiroyuki Hara and Hiroki Oikawa and Yoichi Yamamoto and Masahiko Ishino and Masaharu Nishikino and Tetsuya Makimura and Padraig Dunne and Gerry O'Sullivan and Shigeru Ohta and Ken Kitano and Takeo Ejima and Tadashi Hatano and Takeshi Higashiguchi",

year = "2017",

month = feb,

day = "1",

doi = "10.1063/1.4973926",

language = "English",

volume = "88",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics Publising LLC",

number = "2",

}

TY - JOUR

T1 - Erratum

T2 - Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016) (The Review of scientific instruments (2016) 87 12 (123106))

AU - Dinh, Thanh Hung

AU - Kondo, Yoshiki

AU - Tamura, Toshiki

AU - Ono, Yuichi

AU - Hara, Hiroyuki

AU - Oikawa, Hiroki

AU - Yamamoto, Yoichi

AU - Ishino, Masahiko

AU - Nishikino, Masaharu

AU - Makimura, Tetsuya

AU - Dunne, Padraig

AU - O'Sullivan, Gerry

AU - Ohta, Shigeru

AU - Kitano, Ken

AU - Ejima, Takeo

AU - Hatano, Tadashi

AU - Higashiguchi, Takeshi

PY - 2017/2/1

Y1 - 2017/2/1

UR - http://www.scopus.com/inward/record.url?scp=85076361892&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85076361892&partnerID=8YFLogxK

U2 - 10.1063/1.4973926

DO - 10.1063/1.4973926

M3 - Comment/debate

C2 - 28249516

AN - SCOPUS:85076361892

VL - 88

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 2

ER -