Erratum: Dislocation structure in AlN films induced by in situ transmission electron microscope nanoindentation (Journal of Applied Physics (2012) 112 (093526))

Yuki Tokumoto, Kentaro Kutsukake, Yutaka Ohno, Ichiro Yonenaga

Research output: Contribution to journalComment/debatepeer-review

1 Citation (Scopus)

Fingerprint

Dive into the research topics of 'Erratum: Dislocation structure in AlN films induced by in situ transmission electron microscope nanoindentation (Journal of Applied Physics (2012) 112 (093526))'. Together they form a unique fingerprint.