Erratum: Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure (Mechanics of Materials (2009) 41 (1090-1095))

Masataka Hasegawa; Kazuhiko Sasagawa; Shigeo Uno; Masumi Saka; Hiroyuki Abé

doi:10.1016/j.mechmat.2010.09.004

Erratum: Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure (Mechanics of Materials (2009) 41 (1090-1095))

Masataka Hasegawa, Kazuhiko Sasagawa, Shigeo Uno, Masumi Saka, Hiroyuki Abé

ENG - Finemechanics

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English
Number of pages	1
Journal	Mechanics of Materials
Volume	42
Issue number	11
DOIs	https://doi.org/10.1016/j.mechmat.2010.09.004
Publication status	Published - 2010 Nov 1

ASJC Scopus subject areas

Materials Science(all)
Instrumentation
Mechanics of Materials

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10.1016/j.mechmat.2010.09.004

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Erratum : Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure (Mechanics of Materials (2009) 41 (1090-1095)). / Hasegawa, Masataka; Sasagawa, Kazuhiko; Uno, Shigeo et al.

In: Mechanics of Materials, Vol. 42, No. 11, 01.11.2010.

Research output: Contribution to journal › Comment/debate › peer-review

@article{f3678d54fc86417283d5ae60cb05a395,

title = "Erratum: Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure (Mechanics of Materials (2009) 41 (1090-1095))",

author = "Masataka Hasegawa and Kazuhiko Sasagawa and Shigeo Uno and Masumi Saka and Hiroyuki Ab{\'e}",

year = "2010",

month = nov,

day = "1",

doi = "10.1016/j.mechmat.2010.09.004",

language = "English",

volume = "42",

journal = "Mechanics of Materials",

issn = "0167-6636",

publisher = "Elsevier",

number = "11",

}

TY - JOUR

T1 - Erratum

T2 - Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure (Mechanics of Materials (2009) 41 (1090-1095))

AU - Hasegawa, Masataka

AU - Sasagawa, Kazuhiko

AU - Uno, Shigeo

AU - Saka, Masumi

AU - Abé, Hiroyuki

PY - 2010/11/1

Y1 - 2010/11/1

UR - http://www.scopus.com/inward/record.url?scp=78049247532&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=78049247532&partnerID=8YFLogxK

U2 - 10.1016/j.mechmat.2010.09.004

DO - 10.1016/j.mechmat.2010.09.004

M3 - Comment/debate

AN - SCOPUS:78049247532

VL - 42

JO - Mechanics of Materials

JF - Mechanics of Materials

SN - 0167-6636

IS - 11

ER -

Erratum: Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure (Mechanics of Materials (2009) 41 (1090-1095))

ASJC Scopus subject areas

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