Abstract
In situ superconducting YBa2Cu3O7-x films with Tc0 up to 87 K and Jc, 77 K up to 6×10 4 A/cm2 were prepared on Si substrates with MgAl 2O4 and BaTiO3 double-buffer layers. The epitaxial relations between various layers were established by transmission electron microscopy. The MgAl2O4 layer is heavily faulted. The subsequent BaTiO3 layer stops most of the faults, provides a template for the YBa2Cu3O7-x growth, and partially screens off the stress due to different thermal expansion coefficients. The microstructure of the YBa2Cu3O 7-x layer is very similar to that of the films deposited directly on SrTiO3, exhibiting a homogeneous heavily faulted single-crystal-like structure free from secondary phases and grain boundaries. The slight degradation of the transport properties is attributed to residual thermal stress.
Original language | English |
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Pages (from-to) | 1772-1776 |
Number of pages | 5 |
Journal | Journal of Applied Physics |
Volume | 68 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1990 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy(all)