Abstract
Ti films of 10 nm thickness prepared by evaporation onto NaCl substrates at 250°C have been studied by high-resolution electron microscopy. The films have two characteristic regions: CaF2-type TiHx crystallites predominated, while h.c.p. Ti crystallites containing (1(formula presented)01) and/or ((formula presented)011) twin boundaries grew in the other region. This is the first observation of (1(formula presented)01) twins in evaporated h.c.p. Ti films. Furthermore, misfit dislocations and a gentle bending of the TiHx lattice occurred at the interface between TiHx and h.c.p. Ti, owing to lattice mismatch strains. The orientation relationships and growth mechanism of the epitaxial films, especially of the h.c.p. Ti films, is discussed.
Original language | English |
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Pages (from-to) | 73-85 |
Number of pages | 13 |
Journal | Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties |
Volume | 67 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1993 Jan |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Materials Science(all)
- Condensed Matter Physics
- Physics and Astronomy (miscellaneous)
- Metals and Alloys