Epitaxial cubic and hexagonal crystallites in titanium thin films evaporated onto sodium chloride substrates

Y. Kasukabe; Y. Yamada; L. A. Bursill

doi:10.1080/01418619308207143

Epitaxial cubic and hexagonal crystallites in titanium thin films evaporated onto sodium chloride substrates

Y. Kasukabe, Y. Yamada, L. A. Bursill

Division of Research in Higher Education

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Abstract

Ti films of 10 nm thickness prepared by evaporation onto NaCl substrates at 250°C have been studied by high-resolution electron microscopy. The films have two characteristic regions: CaF₂-type TiH_x crystallites predominated, while h.c.p. Ti crystallites containing (1(formula presented)01) and/or ((formula presented)011) twin boundaries grew in the other region. This is the first observation of (1(formula presented)01) twins in evaporated h.c.p. Ti films. Furthermore, misfit dislocations and a gentle bending of the TiH_x lattice occurred at the interface between TiH_x and h.c.p. Ti, owing to lattice mismatch strains. The orientation relationships and growth mechanism of the epitaxial films, especially of the h.c.p. Ti films, is discussed.

Original language	English
Pages (from-to)	73-85
Number of pages	13
Journal	Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
Volume	67
Issue number	1
DOIs	https://doi.org/10.1080/01418619308207143
Publication status	Published - 1993 Jan

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Materials Science(all)
Condensed Matter Physics
Physics and Astronomy (miscellaneous)
Metals and Alloys

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abstract = "Ti films of 10 nm thickness prepared by evaporation onto NaCl substrates at 250°C have been studied by high-resolution electron microscopy. The films have two characteristic regions: CaF2-type TiHx crystallites predominated, while h.c.p. Ti crystallites containing (1(formula presented)01) and/or ((formula presented)011) twin boundaries grew in the other region. This is the first observation of (1(formula presented)01) twins in evaporated h.c.p. Ti films. Furthermore, misfit dislocations and a gentle bending of the TiHx lattice occurred at the interface between TiHx and h.c.p. Ti, owing to lattice mismatch strains. The orientation relationships and growth mechanism of the epitaxial films, especially of the h.c.p. Ti films, is discussed.",

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T1 - Epitaxial cubic and hexagonal crystallites in titanium thin films evaporated onto sodium chloride substrates

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AU - Yamada, Y.

AU - Bursill, L. A.

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N2 - Ti films of 10 nm thickness prepared by evaporation onto NaCl substrates at 250°C have been studied by high-resolution electron microscopy. The films have two characteristic regions: CaF2-type TiHx crystallites predominated, while h.c.p. Ti crystallites containing (1(formula presented)01) and/or ((formula presented)011) twin boundaries grew in the other region. This is the first observation of (1(formula presented)01) twins in evaporated h.c.p. Ti films. Furthermore, misfit dislocations and a gentle bending of the TiHx lattice occurred at the interface between TiHx and h.c.p. Ti, owing to lattice mismatch strains. The orientation relationships and growth mechanism of the epitaxial films, especially of the h.c.p. Ti films, is discussed.

AB - Ti films of 10 nm thickness prepared by evaporation onto NaCl substrates at 250°C have been studied by high-resolution electron microscopy. The films have two characteristic regions: CaF2-type TiHx crystallites predominated, while h.c.p. Ti crystallites containing (1(formula presented)01) and/or ((formula presented)011) twin boundaries grew in the other region. This is the first observation of (1(formula presented)01) twins in evaporated h.c.p. Ti films. Furthermore, misfit dislocations and a gentle bending of the TiHx lattice occurred at the interface between TiHx and h.c.p. Ti, owing to lattice mismatch strains. The orientation relationships and growth mechanism of the epitaxial films, especially of the h.c.p. Ti films, is discussed.

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