Epitaxial C60 thin films on Bi(0 0 0 1)

J. T. Sadowski, R. Z. Bakhtizin, A. I. Oreshkin, T. Nishihara, A. Al-Mahboob, Y. Fujikawa, K. Nakajima, T. Sakurai

    Research output: Contribution to journalArticlepeer-review

    19 Citations (Scopus)

    Abstract

    We have used the Bi(0 0 0 1)/Si(1 1 1) template to grow highly ordered C60 epitaxial thin films and analyzed them using scanning tunneling microscopy and low-energy electron microscopy. The in situ low-energy electron microscope investigations show that the initial nucleation of the C60 islands on the surface takes place at surface defects, such as domain boundaries and multiple steps. The in-plane lattice parameters of this C60 film turns out to be the same as that of the bulk fcc(1 1 1) C60. The line-on-line epitaxial structure is realized in spite of a weak interaction between the C60 molecules and Bi(0 0 0 1) surface, while scanning tunneling spectroscopy indicates that there is a negligible charge transfer between the molecules and the surface.

    Original languageEnglish
    Pages (from-to)L136-L139
    JournalSurface Science
    Volume601
    Issue number23
    DOIs
    Publication statusPublished - 2007 Dec 1

    Keywords

    • Epitaxy
    • Fullerenes
    • Low energy electron diffraction (LEED)
    • Low-energy electron microscopy (LEEM)
    • Scanning tunneling microscopy

    ASJC Scopus subject areas

    • Condensed Matter Physics
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films
    • Materials Chemistry

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