Enhancement of the selectivity of closed cracks in nonlinear ultrasonic imaging using amplitude difference phased array

Yoshikazu Ohara, Masako Ikeuchi, Kentaro Jinno, Akihiro Ouchi, Satoshi Horinouchi, Kazushi Yamanaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Subharmonic waves realize a high selectivity for closed cracks. However, when a short-burst wave is used to achieve a high temporal resolution, not only closed cracks but also linear scatterers appear in the subharmonic image owing to leakage in frequency filtering. They are ghosts that degrade the selectivity for closed crack in the subharmonic image. Here, we propose an amplitude difference phased array (ADPA), where the ghosts are eliminated by subtracting a subharmonic image at a small input multiplied by the input amplitude ratio from that at a large input. We verified the ADPA method by a two-dimensional simulation based on the finite difference time domain (FDTD) method with damped double nodes (DDNs) for subharmonic imaging of closed cracks. Furthermore, the ADPA method was experimentally verified in a closed-crack specimen.

Original languageEnglish
Title of host publication2012 Proceedings of SICE Annual Conference, SICE 2012
PublisherSociety of Instrument and Control Engineers (SICE)
Pages1177-1180
Number of pages4
ISBN (Print)9781467322591
Publication statusPublished - 2012 Jan 1
Event2012 51st Annual Conference on of the Society of Instrument and Control Engineers of Japan, SICE 2012 - Akita, Japan
Duration: 2012 Aug 202012 Aug 23

Publication series

NameProceedings of the SICE Annual Conference

Other

Other2012 51st Annual Conference on of the Society of Instrument and Control Engineers of Japan, SICE 2012
CountryJapan
CityAkita
Period12/8/2012/8/23

Keywords

  • Amplitude difference phased array (ADPA)
  • closed cracks
  • damped double node (DDN)
  • nonlinear ultrasonic imaging

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Computer Science Applications
  • Electrical and Electronic Engineering

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