Enhanced kerr rotation in electrodeposited nickel films

Karen Attenborough, Jo De Boeck, Jean Pierre Cells, Masaki Mizuguchi, Hiroyuki Akinaga

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

High quality nickel films were electrodeposited directly onto n-GaAs using galvanostatic control. It was seen that by varying the current, density the crystallographic orientation of the films could be controlled. For a current density of 15 mA/cm2, a highly dominant (220) crystallographic orientation was obtained. Magnetic measurements revealed a strong uniaxial anisotropy in these films. Moreover, Kerr spectroscopy measurements (1.4 to 4.5 eV) showed an enhanced Kerr rotation of -0.17° at 3.2 eV, which may be attributed to the strong magnetic anisotropy and the exceptional crystal quality of the films.

Original languageEnglish
Pages (from-to)2985-2987
Number of pages3
JournalIEEE Transactions on Magnetics
Volume35
Issue number5 PART 1
DOIs
Publication statusPublished - 1999 Dec 1
Externally publishedYes

Keywords

  • Anisotropy
  • Electrodeposition
  • GaAs
  • Magneto-optical Kerr spectroscopy
  • Nickel

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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  • Cite this

    Attenborough, K., De Boeck, J., Cells, J. P., Mizuguchi, M., & Akinaga, H. (1999). Enhanced kerr rotation in electrodeposited nickel films. IEEE Transactions on Magnetics, 35(5 PART 1), 2985-2987. https://doi.org/10.1109/20.801055