Energy-dispersive X-ray diffraction(EDXD) technique for structural studies of disordered materials. Application to SiO2, SrP2O6, Pd80Si20, Fe40Ni40P14B6 glasses and liquid Hg

K. Sugiyama, V. P. Petkov, A. S. Takeda

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Structure factors in the wave vector Q region larger than 200 nm-1 and corresponding radial distribution functions with improved resolution for SiO2 and SrP2O6 oxide glasses, Pd80Si20 and Fe40Ni40P14B6 metallic glasses, and liquid Hg have been obtained by the energy dispersive X-ray diffraction (EDXD) method. Structure data obtained by the present study were compared with the previous wide-angle diffraction experiments of the same disordered materials and the reliability and usefulness of EDXD method were demonstrated.

Original languageEnglish
Pages (from-to)49-56
Number of pages8
JournalHigh Temperature Materials and Processes
Volume16
Issue number1
DOIs
Publication statusPublished - 1997 Jan 1

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Physical and Theoretical Chemistry

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