Energy Dispersive X-ray Diffraction Method for Structural Characterization of Non-Crystalline Oxides

Yoshio Waseda, Kazumasa Sugiyama

Research output: Contribution to journalArticlepeer-review

Abstract

The fundamentals of the energy dispersive X-ray diffraction (EDXD) method for materials characterization have been described using the results of non-crystalline oxides. This relatively new method makes it possible to measure the diffraction profiles in the wide wave vector region over 200 nm-1which is beyond the limit (usually 150 nm-1) for conventional angular dispersive X-ray diffraction method. The validity and usefulness of the EDXD method were demonstrated by obtaining the well-resolved radial distribution functions of SiO2glass at room temperature, NaAISi3O8melt at 1460 K and LiNbO3melt at 1550 K.

Original languageEnglish
Pages (from-to)211-220
Number of pages10
JournalHigh Temperature Materials and Processes
Volume22
Issue number3-4
DOIs
Publication statusPublished - 2003 Jan 1

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Physical and Theoretical Chemistry

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