The fundamentals of the energy dispersive X-ray diffraction (EDXD) method for materials characterization have been described using the results of non-crystalline oxides. This relatively new method makes it possible to measure the diffraction profiles in the wide wave vector region over 200 nm-1which is beyond the limit (usually 150 nm-1) for conventional angular dispersive X-ray diffraction method. The validity and usefulness of the EDXD method were demonstrated by obtaining the well-resolved radial distribution functions of SiO2glass at room temperature, NaAISi3O8melt at 1460 K and LiNbO3melt at 1550 K.
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Physical and Theoretical Chemistry