Energy dispersive X-ray diffraction (EDXD) facility for determining structure of high temperature melts with a stationary specimen goniometer

Susumu Takeda, Valery G. Petkov, Kazumasa Sugiyama, Yoshio Waseda

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

A high temperature energy dispersive X-ray diffraction (EDXD) facility has been newly built using a vertical type goniometer, which make it possible to measure the diffraction profiles of melts from room temperature to 1873 K. The fundamentals of this facility were confirmed by obtaining the interference function of a silica glass sample over Q = 200 nm-1 at room temperature using the computer program of PEDX for the generalized radial distribution function analysis of EDXD developed by the present authors (Petkov and Waseda). The feasibility for a high temperature melt was made by applying this EDXD facility to a structural study of liquid bismuth germanate (Bi4Ge3O12) at 1373 K.

Original languageEnglish
Pages (from-to)410-414
Number of pages5
JournalMaterials Transactions, JIM
Volume34
Issue number5
DOIs
Publication statusPublished - 1993
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

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