Emission characteristics of the dielectronic recombination line of atomic Cu and selectively excited ionic Cu line by resonance charge-transfer collision in a low-pressure laser-induced plasma

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

Emisson spectra and time-resolved two-dimensional (2D) emission images of the electron-ion dielectronic recombination (i.e. a reversal process of auto-ionization) line of neutral Cu atoms, the selectively excited Cu ionic line, and normal Cu atomic line were observed for understanding the excitation mechanisms of Cu neutral and ionic lines in a low-pressure laser-induced plasma (LP-LIP) of Ar. From the observations, the number of charged particles around the emitting species seems to increase with increasing Ar pressure. Different time-resolved 2D emission images were observed among the selectively excited Cu ionic line and other Cu emission lines resulting from the different excitation mechanisms of the respective emission lines. Collisions of the second kind and electron-ion recombinations were found to be one of the major excitation mechanisms of Cu in Ar LP-LIP. 2007

Original languageEnglish
Pages (from-to)1127-1132
Number of pages6
Journalanalytical sciences
Volume23
Issue number9
DOIs
Publication statusPublished - 2007 Sep

ASJC Scopus subject areas

  • Analytical Chemistry

Fingerprint Dive into the research topics of 'Emission characteristics of the dielectronic recombination line of atomic Cu and selectively excited ionic Cu line by resonance charge-transfer collision in a low-pressure laser-induced plasma'. Together they form a unique fingerprint.

Cite this