Embedded ultrafine clusters investigated by coincidence Doppler broadening spectroscopy

Y. Nagai, T. Toyama, Z. Tang, M. Hasegawa, S. Yanagita, T. Ohkubo, K. Hono

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Since thermalized positrons in materials are sensitively trapped at their affinitive sites, elemental analysis using coincidence Doppler broadening of positron annihilation gives us the elemental information on the sites exclusively. Here we report, as a good example, the analysis of positron affinitive embedded clusters: ultrafine Cu clusters in Fe. The positron annihilation results are compared with those obtained with a three-dimensional atom probe field ion microscope. Theoretical calculations of positron annihilation are also used to discuss these experimental results.

Original languageEnglish
Title of host publicationPositron Annihilation
Subtitle of host publicationProceedings of the 13th International Conference on Positron Annihilation, ICPA-13
EditorsToshio Hyodo, Haruo Saito, Yoshinori Kobayashi, Yasuyuki Nagashima
PublisherTrans Tech Publications Ltd
Pages11-15
Number of pages5
ISBN (Print)9780878499366
DOIs
Publication statusPublished - 2004 Jan 1
EventPositron Annihilation: Proceedings of the 13th International Conference on Positron Annihilation, ICPA-13 - Kyoto, Japan
Duration: 2003 Sep 72003 Sep 12

Publication series

NameMaterials Science Forum
Volume445-446
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Other

OtherPositron Annihilation: Proceedings of the 13th International Conference on Positron Annihilation, ICPA-13
CountryJapan
CityKyoto
Period03/9/703/9/12

Keywords

  • 3D Atom Probe
  • Coincidence Doppler Broadening
  • Elemental Analysis by Positrons
  • Embedded Clusters
  • Positron Affinity Trapping

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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