Abstract
Microscopic surface images showing a distribution of a designated element was obtained by scanning tunneling microscopy combined with synchrotron radiation light. A tip current induced by photoirradiation is found to increase when the photon energy is just above the absorption edge of a sample element. From the photoinduced current measured during the tip scanning over the surface, element specific images were obtained. An estimated spatial resolution of the chemical imaging is less than 20 nm, better than that achieved by photoemission electron microscopy.
Original language | English |
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Article number | 243119 |
Journal | Applied Physics Letters |
Volume | 89 |
Issue number | 24 |
DOIs | |
Publication status | Published - 2006 Dec 29 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)