Element specific imaging by scanning tunneling microscopy combined with synchrotron radiation light

Toyoaki Eguchi, Taichi Okuda, Takeshi Matsushima, Akira Kataoka, Ayumi Harasawa, Kotone Akiyama, Toyohiko Kinoshita, Yukio Hasegawa, Masanori Kawamori, Yuichi Haruyama, Shinji Matsui

Research output: Contribution to journalArticle

28 Citations (Scopus)

Abstract

Microscopic surface images showing a distribution of a designated element was obtained by scanning tunneling microscopy combined with synchrotron radiation light. A tip current induced by photoirradiation is found to increase when the photon energy is just above the absorption edge of a sample element. From the photoinduced current measured during the tip scanning over the surface, element specific images were obtained. An estimated spatial resolution of the chemical imaging is less than 20 nm, better than that achieved by photoemission electron microscopy.

Original languageEnglish
Article number243119
JournalApplied Physics Letters
Volume89
Issue number24
DOIs
Publication statusPublished - 2006 Dec 29
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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  • Cite this

    Eguchi, T., Okuda, T., Matsushima, T., Kataoka, A., Harasawa, A., Akiyama, K., Kinoshita, T., Hasegawa, Y., Kawamori, M., Haruyama, Y., & Matsui, S. (2006). Element specific imaging by scanning tunneling microscopy combined with synchrotron radiation light. Applied Physics Letters, 89(24), [243119]. https://doi.org/10.1063/1.2399348