@article{1801f3d7d16f486bb2e3e263eb730530,
title = "Element specific imaging by scanning tunneling microscopy combined with synchrotron radiation light",
abstract = "Microscopic surface images showing a distribution of a designated element was obtained by scanning tunneling microscopy combined with synchrotron radiation light. A tip current induced by photoirradiation is found to increase when the photon energy is just above the absorption edge of a sample element. From the photoinduced current measured during the tip scanning over the surface, element specific images were obtained. An estimated spatial resolution of the chemical imaging is less than 20 nm, better than that achieved by photoemission electron microscopy.",
author = "Toyoaki Eguchi and Taichi Okuda and Takeshi Matsushima and Akira Kataoka and Ayumi Harasawa and Kotone Akiyama and Toyohiko Kinoshita and Yukio Hasegawa and Masanori Kawamori and Yuichi Haruyama and Shinji Matsui",
note = "Funding Information: The authors acknowledge Kazuhiko Mase and the staff of the Photon Factory for the stable operation of the light source and the maintenance of the beam line, and the Nano-Processing Partnership Program funded by the Ministry of Education, Science and Technology (MEXT), Japan for sample preparations. The focused ion beam processing in the tip preparation was performed at the Electron Microscope Section of the Materials Design and Characterization Laboratory, ISSP, University of Tokyo. Technical assistance by Masaki Ichihara is highly appreciated.",
year = "2006",
doi = "10.1063/1.2399348",
language = "English",
volume = "89",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "24",
}