TY - JOUR
T1 - Electronic structure of ultrathin bismuth films with A7 and black-phosphorus-like structures
AU - Yaginuma, Shin
AU - Nagaoka, Katsumi
AU - Nagao, Tadaaki
AU - Bihlmayer, Gustav
AU - Koroteev, Yury M.
AU - Chulkov, Eugene V.
AU - Nakayama, Tomonobu
PY - 2008/1/1
Y1 - 2008/1/1
N2 - Using scanning tunneling spectroscopy and first-principles calculations, we have studied the electronic structure of two different ultrathin bismuth films on a Si(111)-7 x 7 substrate; a hexagonal film (HEX film) having a bulklike (A7-like) structure and a film having a black-phosphorus-like structure (BP film). The HEX film is metallic because of spin-orbit (SO)-split surface-state bands lying inside the projected bulk band gap near the Fermi level. Another SO-split surface state is also observed inside the SO gap. The BP film exhibits a significant reduction in metallicity in contrast to the HEX film. This is related to the formation of a very stable paired-layer structure, the mechanism of which is similar to that of the stabilization of semiconducting bulk black P. However, unlike bulk black P, a certain extent of metallicity still remains. This slight metallicity can be associated with buckling and strain in the BP film, which is analogous to the fact that shear angle distortion in bulk Bi is responsible for its semimetallicity.
AB - Using scanning tunneling spectroscopy and first-principles calculations, we have studied the electronic structure of two different ultrathin bismuth films on a Si(111)-7 x 7 substrate; a hexagonal film (HEX film) having a bulklike (A7-like) structure and a film having a black-phosphorus-like structure (BP film). The HEX film is metallic because of spin-orbit (SO)-split surface-state bands lying inside the projected bulk band gap near the Fermi level. Another SO-split surface state is also observed inside the SO gap. The BP film exhibits a significant reduction in metallicity in contrast to the HEX film. This is related to the formation of a very stable paired-layer structure, the mechanism of which is similar to that of the stabilization of semiconducting bulk black P. However, unlike bulk black P, a certain extent of metallicity still remains. This slight metallicity can be associated with buckling and strain in the BP film, which is analogous to the fact that shear angle distortion in bulk Bi is responsible for its semimetallicity.
KW - Bismuth
KW - First-principles calculations
KW - Scanning tunneling spectroscopy
KW - Structural transformation
KW - Surface electronic structure
KW - Ultrathin film
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U2 - 10.1143/JPSJ.77.014701
DO - 10.1143/JPSJ.77.014701
M3 - Article
AN - SCOPUS:38349076046
VL - 77
JO - Journal of the Physical Society of Japan
JF - Journal of the Physical Society of Japan
SN - 0031-9015
IS - 1
M1 - 014701
ER -