Electronic structure of Ti1-xFexO2-δ thin films with oxygen vacancies probed by soft X-ray spectroscopy

Katsuya Usui, Shohei Yamaguchi, Naoya Suzuki, Yuichi Shimazu, Takashi Tsuchiya, Enju Sakai, Masaki Kobayashi, Koji Horiba, Hiroshi Kumigashira, Tohru Higuchi

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3 Citations (Scopus)

Abstract

The physical properties and electronic structure of c-axis-oriented Ti1-xFexO2-δ thin films have been studied by soft X-ray spectroscopy. The c-axis lattice constant increases with increasing Fe concentration. Fe ions have mixed valence states of Fe2+ and Fe3+ with a high-spin configuration. The intensity of the unoccupied Ti 3d state decreases and that of the occupied Ti 3d state increases owing to oxygen vacancies with Fe substitution. The electronic structure in the band gap region consists of Fe 3d and Ti 3d states, which correspond to the remnant of the lower Hubbard hand. The density of states (DOS) at the Fermi level, which is closely related to electrical conductivity, is composed of the Ti 3d state. The electrical conductivity of heavily doped Ti1-xFexO2-δ thin films decreases owing to the electron correlation of Ti 3d electrons.

Original languageEnglish
Article number06FJ07
JournalJapanese journal of applied physics
Volume54
Issue number6
DOIs
Publication statusPublished - 2015 Jun 1
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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    Usui, K., Yamaguchi, S., Suzuki, N., Shimazu, Y., Tsuchiya, T., Sakai, E., Kobayashi, M., Horiba, K., Kumigashira, H., & Higuchi, T. (2015). Electronic structure of Ti1-xFexO2-δ thin films with oxygen vacancies probed by soft X-ray spectroscopy. Japanese journal of applied physics, 54(6), [06FJ07]. https://doi.org/10.7567/JJAP.54.06FJ07