Electronic structure of SrTi 0.99Sc 0.01O 3 thin film studied by high-resolution soft-x-ray spectroscopy

Teppei Okumura, Tomohiro Inoue, Yuji Tasaki, Enju Sakai, Hiroshi Kumigashira, Tohru Higuchi

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

The electronic structure of SrTi 0.99Sc 0.01O 3 thin film has been studied by X-ray absorption spectroscopy (XAS) and high-resolution photoemission spectroscopy (HRPES). The evidence of Sc 3+ substitution into Ti 4+ sites is obtained from the Ti 2p and Sc 2p XAS spectra. The HRPES spectra in the valence band and the core level indicate that the valence band is mainly composed of O 2p state hybridized with Ti 3d state. The Fermi level (E F) locates at ∼1:2eV from the top of the valence band. The energy separation between the top of the valence band and EF is in good agreement with the activation energy (E a), which is estimated from the Arrhenius plot of electrical conductivity. These findings may indicate that the SrTi 0.99Sc 0.01O 3 thin film is ap-type oxide semiconductor with a large E a.

Original languageEnglish
Article number094705
Journaljournal of the physical society of japan
Volume81
Issue number9
DOIs
Publication statusPublished - 2012 Sep
Externally publishedYes

Keywords

  • Conductivity
  • Electronic structure
  • High-resolution photoemission spectroscopy (HRPES)
  • P-type oxide semiconductor
  • SrTi Sc O
  • Thin film

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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