Electronic structure and thermoelectric properties of the delafossite-type oxides CuFe 1-x Ni x O 2

T. Nozaki; K. Hayashi; T. Kajitani

doi:10.1007/s11664-009-0775-6

Electronic structure and thermoelectric properties of the delafossite-type oxides CuFe _1-x Ni _x O ₂

T. Nozaki, K. Hayashi, T. Kajitani

Research output: Contribution to journal › Article

18 Citations (Scopus)

Abstract

In this study, we investigated the chemical composition and electronic structure of the delafossite-type oxides CuFeO ₂ (CFO) and CuFe _0.98Ni _0.02O ₂ (CFNO). The hole carrier density in the Cu and FeO ₂ layers of CFNO was found to be different from that of CFO, leading to the enhancement of electrical conductivity by Ni substitution. In addition, thermoelectric properties were found to be affected by the surface treatment, possibly due to some surface contamination. An etched CFNO (E-CFNO) exhibited a higher electrical conductivity and a higher Seebeck coefficient relative to the polished CFNO (P-CFNO). The thermal conductivity did not change much between E-CFNO and P-CFNO. As a result, the thermoelectric performance of E-CFNO was higher than that of P-CFNO. This result indicates that etching is needed when we use CFNO as a p-leg in thermoelectric generators.

Original language	English
Pages (from-to)	1282-1286
Number of pages	5
Journal	Journal of Electronic Materials
Volume	38
Issue number	7
DOIs	https://doi.org/10.1007/s11664-009-0775-6
Publication status	Published - 2009 Jul 1

Keywords

Chemical composition
CuFeO
Electronic structure
Surface treatment
Thermoelectric properties

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

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Nozaki, T., Hayashi, K., & Kajitani, T. (2009). Electronic structure and thermoelectric properties of the delafossite-type oxides CuFe _1-x Ni _x O ₂ Journal of Electronic Materials, 38(7), 1282-1286. https://doi.org/10.1007/s11664-009-0775-6

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abstract = "In this study, we investigated the chemical composition and electronic structure of the delafossite-type oxides CuFeO 2 (CFO) and CuFe 0.98Ni 0.02O 2 (CFNO). The hole carrier density in the Cu and FeO 2 layers of CFNO was found to be different from that of CFO, leading to the enhancement of electrical conductivity by Ni substitution. In addition, thermoelectric properties were found to be affected by the surface treatment, possibly due to some surface contamination. An etched CFNO (E-CFNO) exhibited a higher electrical conductivity and a higher Seebeck coefficient relative to the polished CFNO (P-CFNO). The thermal conductivity did not change much between E-CFNO and P-CFNO. As a result, the thermoelectric performance of E-CFNO was higher than that of P-CFNO. This result indicates that etching is needed when we use CFNO as a p-leg in thermoelectric generators.",

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AB - In this study, we investigated the chemical composition and electronic structure of the delafossite-type oxides CuFeO 2 (CFO) and CuFe 0.98Ni 0.02O 2 (CFNO). The hole carrier density in the Cu and FeO 2 layers of CFNO was found to be different from that of CFO, leading to the enhancement of electrical conductivity by Ni substitution. In addition, thermoelectric properties were found to be affected by the surface treatment, possibly due to some surface contamination. An etched CFNO (E-CFNO) exhibited a higher electrical conductivity and a higher Seebeck coefficient relative to the polished CFNO (P-CFNO). The thermal conductivity did not change much between E-CFNO and P-CFNO. As a result, the thermoelectric performance of E-CFNO was higher than that of P-CFNO. This result indicates that etching is needed when we use CFNO as a p-leg in thermoelectric generators.

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