Electronic structure and thermoelectric properties of the delafossite-type oxides CuFe 1-x Ni x O 2

T. Nozaki, K. Hayashi, T. Kajitani

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19 Citations (Scopus)


In this study, we investigated the chemical composition and electronic structure of the delafossite-type oxides CuFeO 2 (CFO) and CuFe 0.98Ni 0.02O 2 (CFNO). The hole carrier density in the Cu and FeO 2 layers of CFNO was found to be different from that of CFO, leading to the enhancement of electrical conductivity by Ni substitution. In addition, thermoelectric properties were found to be affected by the surface treatment, possibly due to some surface contamination. An etched CFNO (E-CFNO) exhibited a higher electrical conductivity and a higher Seebeck coefficient relative to the polished CFNO (P-CFNO). The thermal conductivity did not change much between E-CFNO and P-CFNO. As a result, the thermoelectric performance of E-CFNO was higher than that of P-CFNO. This result indicates that etching is needed when we use CFNO as a p-leg in thermoelectric generators.

Original languageEnglish
Pages (from-to)1282-1286
Number of pages5
JournalJournal of Electronic Materials
Issue number7
Publication statusPublished - 2009 Jul


  • Chemical composition
  • CuFeO
  • Electronic structure
  • Surface treatment
  • Thermoelectric properties

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry


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