TY - JOUR
T1 - Electronic structure and thermoelectric properties of the delafossite-type oxides CuFe 1-x Ni x O 2
AU - Nozaki, T.
AU - Hayashi, K.
AU - Kajitani, T.
N1 - Funding Information:
The authors would like to thank Dr. T. Ashino for the chemical composition analysis of the CuFe1–x NixO2 samples. This work is partly supported by Grants-in-Aid for Scientific Research from the Ministry of Education, Culture, Sports, Science, and Technology of Japan.
PY - 2009/7
Y1 - 2009/7
N2 - In this study, we investigated the chemical composition and electronic structure of the delafossite-type oxides CuFeO 2 (CFO) and CuFe 0.98Ni 0.02O 2 (CFNO). The hole carrier density in the Cu and FeO 2 layers of CFNO was found to be different from that of CFO, leading to the enhancement of electrical conductivity by Ni substitution. In addition, thermoelectric properties were found to be affected by the surface treatment, possibly due to some surface contamination. An etched CFNO (E-CFNO) exhibited a higher electrical conductivity and a higher Seebeck coefficient relative to the polished CFNO (P-CFNO). The thermal conductivity did not change much between E-CFNO and P-CFNO. As a result, the thermoelectric performance of E-CFNO was higher than that of P-CFNO. This result indicates that etching is needed when we use CFNO as a p-leg in thermoelectric generators.
AB - In this study, we investigated the chemical composition and electronic structure of the delafossite-type oxides CuFeO 2 (CFO) and CuFe 0.98Ni 0.02O 2 (CFNO). The hole carrier density in the Cu and FeO 2 layers of CFNO was found to be different from that of CFO, leading to the enhancement of electrical conductivity by Ni substitution. In addition, thermoelectric properties were found to be affected by the surface treatment, possibly due to some surface contamination. An etched CFNO (E-CFNO) exhibited a higher electrical conductivity and a higher Seebeck coefficient relative to the polished CFNO (P-CFNO). The thermal conductivity did not change much between E-CFNO and P-CFNO. As a result, the thermoelectric performance of E-CFNO was higher than that of P-CFNO. This result indicates that etching is needed when we use CFNO as a p-leg in thermoelectric generators.
KW - Chemical composition
KW - CuFeO
KW - Electronic structure
KW - Surface treatment
KW - Thermoelectric properties
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U2 - 10.1007/s11664-009-0775-6
DO - 10.1007/s11664-009-0775-6
M3 - Article
AN - SCOPUS:67650450888
VL - 38
SP - 1282
EP - 1286
JO - Journal of Electronic Materials
JF - Journal of Electronic Materials
SN - 0361-5235
IS - 7
ER -