Electron-Strain Interaction in Valence Fluctuation Compound SmB6

Shintaro Nakamura; Terutaka Goto; Mitsuo Kasaya; Satoru Kunii

doi:10.1143/JPSJ.60.4311

Electron-Strain Interaction in Valence Fluctuation Compound SmB6

Shintaro Nakamura, Terutaka Goto, Mitsuo Kasaya, Satoru Kunii

Institute for Materials Research (IMR) (institute affiliation only)

Research output: Contribution to journal › Article › peer-review

38 Citations (Scopus)

Abstract

Temperature dependence of the elastic constants in the valence fluctuation compound of SmB6 and the reference one of LaB6 has been investigated by an ultrasonic method. The DC sputtering technique of a piezoelectric ZnO film on SmB6 has been employed for a reliable ultrasonic measurement free from bond breaks. A remarkable softening of the bulk modulus CB and an anomaly of the C44 mode in SmB6 are responsible for the interaction between the elastic strain and the narrow 4f-band state with the energy gap of 160 K around the Fermi level.

Original language	English
Pages (from-to)	4311-4318
Number of pages	8
Journal	journal of the physical society of japan
Volume	60
Issue number	12
DOIs	https://doi.org/10.1143/JPSJ.60.4311
Publication status	Published - 1991 Jan 1

ASJC Scopus subject areas

Physics and Astronomy(all)

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abstract = "Temperature dependence of the elastic constants in the valence fluctuation compound of SmB6 and the reference one of LaB6 has been investigated by an ultrasonic method. The DC sputtering technique of a piezoelectric ZnO film on SmB6 has been employed for a reliable ultrasonic measurement free from bond breaks. A remarkable softening of the bulk modulus CB and an anomaly of the C44 mode in SmB6 are responsible for the interaction between the elastic strain and the narrow 4f-band state with the energy gap of 160 K around the Fermi level.",

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AU - Nakamura, Shintaro

AU - Goto, Terutaka

AU - Kasaya, Mitsuo

AU - Kunii, Satoru

PY - 1991/1/1

Y1 - 1991/1/1

N2 - Temperature dependence of the elastic constants in the valence fluctuation compound of SmB6 and the reference one of LaB6 has been investigated by an ultrasonic method. The DC sputtering technique of a piezoelectric ZnO film on SmB6 has been employed for a reliable ultrasonic measurement free from bond breaks. A remarkable softening of the bulk modulus CB and an anomaly of the C44 mode in SmB6 are responsible for the interaction between the elastic strain and the narrow 4f-band state with the energy gap of 160 K around the Fermi level.

AB - Temperature dependence of the elastic constants in the valence fluctuation compound of SmB6 and the reference one of LaB6 has been investigated by an ultrasonic method. The DC sputtering technique of a piezoelectric ZnO film on SmB6 has been employed for a reliable ultrasonic measurement free from bond breaks. A remarkable softening of the bulk modulus CB and an anomaly of the C44 mode in SmB6 are responsible for the interaction between the elastic strain and the narrow 4f-band state with the energy gap of 160 K around the Fermi level.

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Electron-Strain Interaction in Valence Fluctuation Compound SmB6

Abstract

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