Electron-Strain Interaction in Valence Fluctuation Compound SmB6

Shintaro Nakamura; Terutaka Goto; Mitsuo Kasaya; Satoru Kunii

doi:10.1143/JPSJ.60.4311

Electron-Strain Interaction in Valence Fluctuation Compound SmB6

Shintaro Nakamura, Terutaka Goto, Mitsuo Kasaya, Satoru Kunii

Institute for Materials Research (IMR) (institute affiliation only)

Research output: Contribution to journal › Article › peer-review

37 Citations (Scopus)

Abstract

Temperature dependence of the elastic constants in the valence fluctuation compound of SmB6 and the reference one of LaB6 has been investigated by an ultrasonic method. The DC sputtering technique of a piezoelectric ZnO film on SmB6 has been employed for a reliable ultrasonic measurement free from bond breaks. A remarkable softening of the bulk modulus CB and an anomaly of the C44 mode in SmB6 are responsible for the interaction between the elastic strain and the narrow 4f-band state with the energy gap of 160 K around the Fermi level.

Original language	English
Pages (from-to)	4311-4318
Number of pages	8
Journal	journal of the physical society of japan
Volume	60
Issue number	12
DOIs	https://doi.org/10.1143/JPSJ.60.4311
Publication status	Published - 1991 Jan 1

ASJC Scopus subject areas

Physics and Astronomy(all)

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@article{b834612235db4d5ea1164d048fc07946,

title = "Electron-Strain Interaction in Valence Fluctuation Compound SmB6",

abstract = "Temperature dependence of the elastic constants in the valence fluctuation compound of SmB6 and the reference one of LaB6 has been investigated by an ultrasonic method. The DC sputtering technique of a piezoelectric ZnO film on SmB6 has been employed for a reliable ultrasonic measurement free from bond breaks. A remarkable softening of the bulk modulus CB and an anomaly of the C44 mode in SmB6 are responsible for the interaction between the elastic strain and the narrow 4f-band state with the energy gap of 160 K around the Fermi level.",

author = "Shintaro Nakamura and Terutaka Goto and Mitsuo Kasaya and Satoru Kunii",

year = "1991",

month = jan,

day = "1",

doi = "10.1143/JPSJ.60.4311",

language = "English",

volume = "60",

pages = "4311--4318",

journal = "Journal of the Physical Society of Japan",

issn = "0031-9015",

publisher = "Physical Society of Japan",

number = "12",

}

TY - JOUR

T1 - Electron-Strain Interaction in Valence Fluctuation Compound SmB6

AU - Nakamura, Shintaro

AU - Goto, Terutaka

AU - Kasaya, Mitsuo

AU - Kunii, Satoru

PY - 1991/1/1

Y1 - 1991/1/1

N2 - Temperature dependence of the elastic constants in the valence fluctuation compound of SmB6 and the reference one of LaB6 has been investigated by an ultrasonic method. The DC sputtering technique of a piezoelectric ZnO film on SmB6 has been employed for a reliable ultrasonic measurement free from bond breaks. A remarkable softening of the bulk modulus CB and an anomaly of the C44 mode in SmB6 are responsible for the interaction between the elastic strain and the narrow 4f-band state with the energy gap of 160 K around the Fermi level.

AB - Temperature dependence of the elastic constants in the valence fluctuation compound of SmB6 and the reference one of LaB6 has been investigated by an ultrasonic method. The DC sputtering technique of a piezoelectric ZnO film on SmB6 has been employed for a reliable ultrasonic measurement free from bond breaks. A remarkable softening of the bulk modulus CB and an anomaly of the C44 mode in SmB6 are responsible for the interaction between the elastic strain and the narrow 4f-band state with the energy gap of 160 K around the Fermi level.

UR - http://www.scopus.com/inward/record.url?scp=33747395608&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33747395608&partnerID=8YFLogxK

U2 - 10.1143/JPSJ.60.4311

DO - 10.1143/JPSJ.60.4311

M3 - Article

AN - SCOPUS:33747395608

VL - 60

SP - 4311

EP - 4318

JO - Journal of the Physical Society of Japan

JF - Journal of the Physical Society of Japan

SN - 0031-9015

IS - 12

ER -