Electron spectroscopy of rare-gas clusters irradiated by x-ray free-electron laser pulses from SACLA

H. Fukuzawa, T. Tachibana, K. Motomura, W. Q. Xu, K. Nagaya, S. Wada, P. Johnsson, M. Siano, S. Mondal, Y. Ito, M. Kimura, T. Sakai, K. Matsunami, H. Hayashita, J. Kajikawa, X. J. Liu, E. Robert, C. Miron, R. Feifel, J. P. MarangosK. Tono, Y. Inubushi, M. Yabashi, M. Yao, K. Ueda

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Abstract

We have measured electron energy spectra and asymmetry parameters of Ar clusters and Xe clusters illuminated by intense x-rays at 5 and 5.5 keV. A velocity map imaging spectrometer was developed for this purpose and employed at an x-ray free-electron laser facility, SACLA in Japan. The cluster size dependence and the peak fluence dependence of the electron spectra and asymmetry parameters are discussed.

Original languageEnglish
Article number034004
JournalJournal of Physics B: Atomic, Molecular and Optical Physics
Volume49
Issue number3
DOIs
Publication statusPublished - 2016 Jan 8

Keywords

  • XFE
  • nanoplasma
  • rare-gas cluster

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics

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