Electron-ion-ion triple-coincidence spectroscopic study of site-specific fragmentation caused by Si:2p core-level photoionization of F3 SiCH2 CH2 Si (CH3) 3 vapor

S. Nagaoka, G. Prümper, H. Fukuzawa, M. Hino, M. Takemoto, Y. Tamenori, J. Harries, I. H. Suzuki, O. Takahashi, K. Okada, K. Tabayashi, X. J. Liu, T. Lischke, K. Ueda

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Abstract

Site-specific fragmentation caused by Si:2p core-level photoionization of F3 SiCH2 CH2 Si (CH3) 3 vapor was studied by means of high-resolution energy-selected-electron photoion-photoion triple-coincidence spectroscopy. The ab initio molecular orbital method was used for the theoretical description. F3 SiCH2 CH2 + - Si (CH3) 3 + ion pairs were produced by the 2p photoionization of the Si atoms bonded to the three methyl groups, and SiF+ -containing ion pairs were produced by the 2p photoionization of the Si atoms bonded to the three F atoms.

Original languageEnglish
Article number020502
JournalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume75
Issue number2
DOIs
Publication statusPublished - 2007 Feb 20

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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    Nagaoka, S., Prümper, G., Fukuzawa, H., Hino, M., Takemoto, M., Tamenori, Y., Harries, J., Suzuki, I. H., Takahashi, O., Okada, K., Tabayashi, K., Liu, X. J., Lischke, T., & Ueda, K. (2007). Electron-ion-ion triple-coincidence spectroscopic study of site-specific fragmentation caused by Si:2p core-level photoionization of F3 SiCH2 CH2 Si (CH3) 3 vapor. Physical Review A - Atomic, Molecular, and Optical Physics, 75(2), [020502]. https://doi.org/10.1103/PhysRevA.75.020502