Electron holography for improved measurement of microfields in nanoelectrode assemblies

Li Jen Chou; Mu Tung Chang; Yu Lun Chueh; Joong Jung Kim; Hyun Soon Park; Daisuke Shindo

doi:10.1063/1.2221748

Electron holography for improved measurement of microfields in nanoelectrode assemblies

Li Jen Chou, Mu Tung Chang, Yu Lun Chueh, Joong Jung Kim, Hyun Soon Park, Daisuke Shindo

Center for Advanced Microscopy and Spectroscopy

Research output: Contribution to journal › Article

9 Citations (Scopus)

Abstract

An approach to investigate the electric field distribution and field-emission property of a single crystal tungsten oxide (WO₃) nanowire by electron holography technique is presented, which solves the problems encountered in the traditional reconstruction of the holograms, the so-called perturbed reference wave. We proposed this unique method to meticulously illustrate the status of the surroundings of a single crystal nanowire under biased conditions. This paves the way to precisely quantifying the electric and magnetic field distributions for nanostructures as well as nanodevices.

Original language	English
Article number	023112
Journal	Applied Physics Letters
Volume	89
Issue number	2
DOIs	https://doi.org/10.1063/1.2221748
Publication status	Published - 2006 Jul 24

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.2221748

Fingerprint Dive into the research topics of 'Electron holography for improved measurement of microfields in nanoelectrode assemblies'. Together they form a unique fingerprint.

Cite this

Chou, L. J., Chang, M. T., Chueh, Y. L., Kim, J. J., Park, H. S., & Shindo, D. (2006). Electron holography for improved measurement of microfields in nanoelectrode assemblies. Applied Physics Letters, 89(2), [023112]. https://doi.org/10.1063/1.2221748

@article{2c34e4a7a3d5404db95206f5bc58e71b,

title = "Electron holography for improved measurement of microfields in nanoelectrode assemblies",

abstract = "An approach to investigate the electric field distribution and field-emission property of a single crystal tungsten oxide (WO3) nanowire by electron holography technique is presented, which solves the problems encountered in the traditional reconstruction of the holograms, the so-called perturbed reference wave. We proposed this unique method to meticulously illustrate the status of the surroundings of a single crystal nanowire under biased conditions. This paves the way to precisely quantifying the electric and magnetic field distributions for nanostructures as well as nanodevices.",

author = "Chou, {Li Jen} and Chang, {Mu Tung} and Chueh, {Yu Lun} and Kim, {Joong Jung} and Park, {Hyun Soon} and Daisuke Shindo",

year = "2006",

month = jul,

day = "24",

doi = "10.1063/1.2221748",

language = "English",

volume = "89",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "2",

}

TY - JOUR

T1 - Electron holography for improved measurement of microfields in nanoelectrode assemblies

AU - Chou, Li Jen

AU - Chang, Mu Tung

AU - Chueh, Yu Lun

AU - Kim, Joong Jung

AU - Park, Hyun Soon

AU - Shindo, Daisuke

PY - 2006/7/24

Y1 - 2006/7/24

N2 - An approach to investigate the electric field distribution and field-emission property of a single crystal tungsten oxide (WO3) nanowire by electron holography technique is presented, which solves the problems encountered in the traditional reconstruction of the holograms, the so-called perturbed reference wave. We proposed this unique method to meticulously illustrate the status of the surroundings of a single crystal nanowire under biased conditions. This paves the way to precisely quantifying the electric and magnetic field distributions for nanostructures as well as nanodevices.

AB - An approach to investigate the electric field distribution and field-emission property of a single crystal tungsten oxide (WO3) nanowire by electron holography technique is presented, which solves the problems encountered in the traditional reconstruction of the holograms, the so-called perturbed reference wave. We proposed this unique method to meticulously illustrate the status of the surroundings of a single crystal nanowire under biased conditions. This paves the way to precisely quantifying the electric and magnetic field distributions for nanostructures as well as nanodevices.

UR - http://www.scopus.com/inward/record.url?scp=33746064479&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33746064479&partnerID=8YFLogxK

U2 - 10.1063/1.2221748

DO - 10.1063/1.2221748

M3 - Article

AN - SCOPUS:33746064479

VL - 89

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 2

M1 - 023112

ER -