Electron holography for improved measurement of microfields in nanoelectrode assemblies

Li Jen Chou, Mu Tung Chang, Yu Lun Chueh, Joong Jung Kim, Hyun Soon Park, Daisuke Shindo

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

An approach to investigate the electric field distribution and field-emission property of a single crystal tungsten oxide (WO3) nanowire by electron holography technique is presented, which solves the problems encountered in the traditional reconstruction of the holograms, the so-called perturbed reference wave. We proposed this unique method to meticulously illustrate the status of the surroundings of a single crystal nanowire under biased conditions. This paves the way to precisely quantifying the electric and magnetic field distributions for nanostructures as well as nanodevices.

Original languageEnglish
Article number023112
JournalApplied Physics Letters
Volume89
Issue number2
DOIs
Publication statusPublished - 2006 Jul 24

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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    Chou, L. J., Chang, M. T., Chueh, Y. L., Kim, J. J., Park, H. S., & Shindo, D. (2006). Electron holography for improved measurement of microfields in nanoelectrode assemblies. Applied Physics Letters, 89(2), [023112]. https://doi.org/10.1063/1.2221748