TY - JOUR
T1 - Electron energy loss spectroscopy study of cerium stabilised zirconia
T2 - An application of valence determination in rare earth systems
AU - Yuan, J.
AU - Hirayama, T.
AU - Ikuhara, Y.
AU - Sakuma, T.
N1 - Copyright:
Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.
PY - 1999/4
Y1 - 1999/4
N2 - We have used the electron energy loss spectroscopy to study the valence state of cerium and the lattice distortion in Ce doped ZrO2 ceramic from the fine structure in oxygen K-edge. We showed that the fine structure of Ce M4,5 absorption edges is an excellent signature of the Ce valence state in the samples. This procedure is compared with other means of valence determination, such as white line intensity and branch ratio. Through the knowledge of the cerium oxidation state, we obtained information about the charge-compensating point defect in the samples. This is correlated with the distortion in the local atomic structure of zirconia. Our results showed the importance of covalent bonding for the phase-stabilisation mechanism in this ceramic system.
AB - We have used the electron energy loss spectroscopy to study the valence state of cerium and the lattice distortion in Ce doped ZrO2 ceramic from the fine structure in oxygen K-edge. We showed that the fine structure of Ce M4,5 absorption edges is an excellent signature of the Ce valence state in the samples. This procedure is compared with other means of valence determination, such as white line intensity and branch ratio. Through the knowledge of the cerium oxidation state, we obtained information about the charge-compensating point defect in the samples. This is correlated with the distortion in the local atomic structure of zirconia. Our results showed the importance of covalent bonding for the phase-stabilisation mechanism in this ceramic system.
KW - Cerium
KW - Electron energy loss spectroscopy
KW - Oxygen K-edge
KW - Zirconia
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U2 - 10.1016/S0968-4328(99)00017-7
DO - 10.1016/S0968-4328(99)00017-7
M3 - Article
AN - SCOPUS:0032996203
VL - 30
SP - 141
EP - 145
JO - Micron and Microscopica Acta
JF - Micron and Microscopica Acta
SN - 0968-4328
IS - 2
ER -