Electron emission mechanism of doped CVD diamond characterised by combined XPS/UPS/FES system

H. Yamaguchi, I. Saito, Y. Kudo, T. Masuzawa, M. Takahashi, T. Yamada, M. Kudo, Y. Takakuwa, K. Okano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationIVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium
Pages29-30
Number of pages2
DOIs
Publication statusPublished - 2006 Dec 1
Event19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006 - Guilin, China
Duration: 2006 Jul 172006 Jul 20

Publication series

NameIVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium

Other

Other19th International Vacuum Nanoelecronics Conference and 50th International Field Emission Symposium, IVNC and IFES 2006
CountryChina
CityGuilin
Period06/7/1706/7/20

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Yamaguchi, H., Saito, I., Kudo, Y., Masuzawa, T., Takahashi, M., Yamada, T., Kudo, M., Takakuwa, Y., & Okano, K. (2006). Electron emission mechanism of doped CVD diamond characterised by combined XPS/UPS/FES system. In IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium (pp. 29-30). [4134443] (IVNC and IFES 2006 - Technical Digest - l9th International Vacuum Nanoelectronics Conference and 50th International Field Emission Symposium). https://doi.org/10.1109/IVNC.2006.335318