Abstract
Epitaxially-grown SnxTi1 - xO2 alloy thin films with different compositions were fabricated by successive deposition of SnO2 on ultra-smooth Nb-doped TiO2 (rutile) (110) substrates. The surface Sn atoms of the SnxTi1 - xO 2, which took a tetravalent state just after the deposition under the present condition, were reduced into a metallic state by electron beam irradiation, but not for a pure SnO2 film. The reduction process approximately obeys zero-order kinetics; the reaction rate constant linearly increases with an increase of the surface composition of Ti. Based on these results, the reduction mechanism is discussed.
Original language | English |
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Pages (from-to) | 2555-2558 |
Number of pages | 4 |
Journal | Thin Solid Films |
Volume | 519 |
Issue number | 8 |
DOIs | |
Publication status | Published - 2011 Feb 1 |
Externally published | Yes |
Keywords
- Alloys
- Auger electron spectroscopy
- Thin film
- Tin oxides
- Titanium oxide
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry