Electromagnetic near field measurements by using magnet garnet crystal

M. Takahashi, K. Kawasaki, H. Ohba, T. Ikenaga, H. Ota, T. Orikasa, N. Adachi, K. Ishiyama, K. I. Arai

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Abstract

An optical scanning electromagnetic field probe system consisting of an optic crystal substrate and a galvano scanner has been developed for high speed, low-invasive measurement of electromagnetic near field distribution. We measured magnetic field distributions above a microstrip line using several magnetic garnet crystal substrates and the probe system. We observed that the frequency response in the gigahertz range improved when we applied a magnetic bias to the crystal. In addition, a magnetic field component in a particular direction could be detected by controlling the direction of the magnetic bias.

Original languageEnglish
Article number09E711
JournalJournal of Applied Physics
Volume107
Issue number9
DOIs
Publication statusPublished - 2010 May 1

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Takahashi, M., Kawasaki, K., Ohba, H., Ikenaga, T., Ota, H., Orikasa, T., Adachi, N., Ishiyama, K., & Arai, K. I. (2010). Electromagnetic near field measurements by using magnet garnet crystal. Journal of Applied Physics, 107(9), [09E711]. https://doi.org/10.1063/1.3337726