TY - GEN
T1 - Electromagnetic information leakage from cryptographic devices
AU - Homma, Naofumi
AU - Hayashi, Yu-Ichi
AU - Aoki, Takafumi
PY - 2013
Y1 - 2013
N2 - This paper presents an overview of electromagnetic information security on cryptographic devices. The research area includes theoretical studies on information propagation via electromagnetic (EM) fields; acquisition, measurement, and analysis techniques for information leakage from information and communication devices via EM fields; modeling and simulation techniques for evaluation of EM information leakage; counter-measures against attacks based on EM information leakage; and intentional EM interference (IEMI) and electrostatic discharge (ESD) threats related to information leakage. In this paper, we briefly explain the fundamentals of EM information security: typical mechanisms of information leakage via EM fields, possible countermeasures, and ongoing standardization efforts.
AB - This paper presents an overview of electromagnetic information security on cryptographic devices. The research area includes theoretical studies on information propagation via electromagnetic (EM) fields; acquisition, measurement, and analysis techniques for information leakage from information and communication devices via EM fields; modeling and simulation techniques for evaluation of EM information leakage; counter-measures against attacks based on EM information leakage; and intentional EM interference (IEMI) and electrostatic discharge (ESD) threats related to information leakage. In this paper, we briefly explain the fundamentals of EM information security: typical mechanisms of information leakage via EM fields, possible countermeasures, and ongoing standardization efforts.
KW - Cryptographic devices
KW - Electromagnetic information leakage
KW - Hardware attacks
KW - System security
UR - http://www.scopus.com/inward/record.url?scp=84890712957&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84890712957&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84890712957
SN - 9781467349796
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 401
EP - 404
BT - Proceedings of the 2013 International Symposium on Electromagnetic Compatibility, EMC Europe 2013
T2 - 2013 International Symposium on Electromagnetic Compatibility, EMC Europe 2013
Y2 - 2 September 2013 through 6 September 2013
ER -