Electromagnetic field distribution measurements using an optically scanning probe system

Masanori Takahashi, Katsumi Kawasaki, Hiroyuki Ohba, Hiroyasu Ota, Tatsuru Orikasa, Kazushi Ishiyama, Nobuyasu Adachi, Ken Ichi Arai

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

An optically scanning electromagnetic field probe system, consisting of an electro-optic or magneto-optic crystal substrate and a galvano scanner, has been developed for high speed, low-invasive measurement of electromagnetic field distribution. We present some examples of measurement of electric field distributions using a LiNbO3 crystal substrate and the probe system. We have also measured magnetic field distributions above an MSL using a magnetic garnet thin film in the gigahertz range.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility, EMC 2007
DOIs
Publication statusPublished - 2007 Dec 1
EventIEEE International Symposium on Electromagnetic Compatibility, EMC 2007 - Honolulu, HI, United States
Duration: 2007 Jul 92007 Jul 13

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076

Conference

ConferenceIEEE International Symposium on Electromagnetic Compatibility, EMC 2007
CountryUnited States
CityHonolulu, HI
Period07/7/907/7/13

Keywords

  • Electro-optic effect
  • Electromagnetic field
  • Galvano scanner
  • Magneto-optic effect

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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