Electromagnetic enhancement effect in scanning tunneling microscope light emission from GaAs

Y. Uehara, H. Gotoh, R. Arafune, S. Ushioda

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The finite difference time domain method was used to study the electromagnetic enhancement effect in scanning tunneling microscope (STM) light emission from GaAs. The intensity of light emitted by the recombination of minority carriers injected from the tip and majority carriers in the sample were determined. STM light emission was found weak as the tunneling current was limited to a nanoampere level to avoid sample damage.

Original languageEnglish
Pages (from-to)3784-3788
Number of pages5
JournalJournal of Applied Physics
Volume93
Issue number7
DOIs
Publication statusPublished - 2003 Apr 1

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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