The finite difference time domain method was used to study the electromagnetic enhancement effect in scanning tunneling microscope (STM) light emission from GaAs. The intensity of light emitted by the recombination of minority carriers injected from the tip and majority carriers in the sample were determined. STM light emission was found weak as the tunneling current was limited to a nanoampere level to avoid sample damage.
ASJC Scopus subject areas
- Physics and Astronomy(all)