TY - GEN
T1 - Electrodeposition of carbon nanotubes-Cu composite for microelectrical elements applications
AU - An, Zhonglie
AU - Toda, Masaya
AU - Ono, Takahito
PY - 2016/2/26
Y1 - 2016/2/26
N2 - In this paper, we present the electrodeposition of copper (Cu) composites with high contents of carbon nanotubes (CNTs), and evaluate the mechanical, electrical and thermal properties of the composites. A novel electroplating method is developed for the electrodeposition of the CNTs-Cu composite with two kinds of multi-walled CNTs (MWCNTs), thermally-annealed at 1200°C and 2600°C. The weight fractions of the CNTs in the composites are 5.0 wt%, and 2.8 wt%, and the Young's moduli of the composites are approximately 1.2 times and 1.1 times greater than that of the Cu film, respectively. The composites exhibit 26% and 16% lower coefficients of thermal expansion (CTE) than that of the Cu, and possess the same electrical resistivity with the Cu. This results show that the CNTs-Cu composite is ideally suited for microelectrical elements applications.
AB - In this paper, we present the electrodeposition of copper (Cu) composites with high contents of carbon nanotubes (CNTs), and evaluate the mechanical, electrical and thermal properties of the composites. A novel electroplating method is developed for the electrodeposition of the CNTs-Cu composite with two kinds of multi-walled CNTs (MWCNTs), thermally-annealed at 1200°C and 2600°C. The weight fractions of the CNTs in the composites are 5.0 wt%, and 2.8 wt%, and the Young's moduli of the composites are approximately 1.2 times and 1.1 times greater than that of the Cu film, respectively. The composites exhibit 26% and 16% lower coefficients of thermal expansion (CTE) than that of the Cu, and possess the same electrical resistivity with the Cu. This results show that the CNTs-Cu composite is ideally suited for microelectrical elements applications.
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U2 - 10.1109/MEMSYS.2016.7421678
DO - 10.1109/MEMSYS.2016.7421678
M3 - Conference contribution
AN - SCOPUS:84970939847
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 528
EP - 531
BT - MEMS 2016 - 29th IEEE International Conference on Micro Electro Mechanical Systems
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 29th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2016
Y2 - 24 January 2016 through 28 January 2016
ER -