Electrical transport characteristics of Bi2Sr2CaCu2O8+δ stacked junctions with control of the carrier density

Kunihiro Inomata, Takeshi Kawae, Sang Jae Kim, Kensuke Nakajima, Tsutomu Yamashita, Shigeo Sato, Koji Nakajima, Takeshi Hatano

Research output: Contribution to journalConference articlepeer-review

3 Citations (Scopus)


The control of the critical current density (Jc) and the junction resistance (RN) along the c-axis of intrinsic Josephson junctions (IJJs) on a high-Tc superconductor is very important for applying the IJJs to electronic devices. For controlling these junction parameters, we have clarified the relationship of Jc, RN and the carrier density in Bi2Sr2CaCu2O8+δ whiskers by changing the carrier density with an annealing process. We determined the electrical transport characteristics of the IJJs. As a result, the Jc increased, and the RN decreased systematically when the carrier density increased. The values of Jc and RN could be controlled by a change in the carrier density.

Original languageEnglish
Pages (from-to)1365-1367
Number of pages3
JournalSuperconductor Science and Technology
Issue number12
Publication statusPublished - 2003 Dec 1
EventISEC 2003, International Superconducting Electronics Conference - Sydney,NSW, Australia
Duration: 2003 Jul 72003 Jul 11

ASJC Scopus subject areas

  • Ceramics and Composites
  • Condensed Matter Physics
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry

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