Electrical transport characteristics of Bi2Sr2CaCu2O8+δ stacked junctions with control of the carrier density

Kunihiro Inomata, Takeshi Kawae, Sang Jae Kim, Kensuke Nakajima, Tsutomu Yamashita, Shigeo Sato, Koji Nakajima, Takeshi Hatano

Research output: Contribution to journalConference article

3 Citations (Scopus)

Abstract

The control of the critical current density (Jc) and the junction resistance (RN) along the c-axis of intrinsic Josephson junctions (IJJs) on a high-Tc superconductor is very important for applying the IJJs to electronic devices. For controlling these junction parameters, we have clarified the relationship of Jc, RN and the carrier density in Bi2Sr2CaCu2O8+δ whiskers by changing the carrier density with an annealing process. We determined the electrical transport characteristics of the IJJs. As a result, the Jc increased, and the RN decreased systematically when the carrier density increased. The values of Jc and RN could be controlled by a change in the carrier density.

Original languageEnglish
Pages (from-to)1365-1367
Number of pages3
JournalSuperconductor Science and Technology
Volume16
Issue number12
DOIs
Publication statusPublished - 2003 Dec 1
EventISEC 2003, International Superconducting Electronics Conference - Sydney,NSW, Australia
Duration: 2003 Jul 72003 Jul 11

ASJC Scopus subject areas

  • Ceramics and Composites
  • Condensed Matter Physics
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Electrical transport characteristics of Bi<sub>2</sub>Sr<sub>2</sub>CaCu<sub>2</sub>O<sub>8+δ</sub> stacked junctions with control of the carrier density'. Together they form a unique fingerprint.

  • Cite this