Electrical properties of Bi-2212 whisker using Ag film electrodes

T. Kawae; S. J. Kim; K. Nakajima; T. Yamashita; S. Kishida

doi:10.1016/S0921-4534(01)00699-2

Electrical properties of Bi-2212 whisker using Ag film electrodes

T. Kawae, S. J. Kim, K. Nakajima, T. Yamashita, S. Kishida

Research Institute of Electrical Communication (RIEC)

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

We report a fabrication method of integrated film-type small Ag electrodes using conventional dry-etching techniques on a Bi-2212 whisker. We also investigated the electrical characteristics of Bi-2212 stacks fabricated by focused ion beam etching using these electrodes. The electrodes offered good electrical contact without causing any loads or damage to the stack junction.

Original language	English
Pages (from-to)	333-337
Number of pages	5
Journal	Physica C: Superconductivity and its applications
Volume	362
Issue number	1-4
DOIs	https://doi.org/10.1016/S0921-4534(01)00699-2
Publication status	Published - 2001 Sep 1

Keywords

Bi-2212 whisker
Intrinsic Josephson junction
Small Ag film electrodes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

Access to Document

10.1016/S0921-4534(01)00699-2

Fingerprint Dive into the research topics of 'Electrical properties of Bi-2212 whisker using Ag film electrodes'. Together they form a unique fingerprint.

Cite this

@article{c716970b11354257b10f7f6a282da4bb,

title = "Electrical properties of Bi-2212 whisker using Ag film electrodes",

abstract = "We report a fabrication method of integrated film-type small Ag electrodes using conventional dry-etching techniques on a Bi-2212 whisker. We also investigated the electrical characteristics of Bi-2212 stacks fabricated by focused ion beam etching using these electrodes. The electrodes offered good electrical contact without causing any loads or damage to the stack junction.",

keywords = "Bi-2212 whisker, Intrinsic Josephson junction, Small Ag film electrodes",

author = "T. Kawae and Kim, {S. J.} and K. Nakajima and T. Yamashita and S. Kishida",

year = "2001",

month = sep,

day = "1",

doi = "10.1016/S0921-4534(01)00699-2",

language = "English",

volume = "362",

pages = "333--337",

journal = "Physica C: Superconductivity and its Applications",

issn = "0921-4534",

publisher = "Elsevier",

number = "1-4",

}

TY - JOUR

T1 - Electrical properties of Bi-2212 whisker using Ag film electrodes

AU - Kawae, T.

AU - Kim, S. J.

AU - Nakajima, K.

AU - Yamashita, T.

AU - Kishida, S.

PY - 2001/9/1

Y1 - 2001/9/1

N2 - We report a fabrication method of integrated film-type small Ag electrodes using conventional dry-etching techniques on a Bi-2212 whisker. We also investigated the electrical characteristics of Bi-2212 stacks fabricated by focused ion beam etching using these electrodes. The electrodes offered good electrical contact without causing any loads or damage to the stack junction.

AB - We report a fabrication method of integrated film-type small Ag electrodes using conventional dry-etching techniques on a Bi-2212 whisker. We also investigated the electrical characteristics of Bi-2212 stacks fabricated by focused ion beam etching using these electrodes. The electrodes offered good electrical contact without causing any loads or damage to the stack junction.

KW - Bi-2212 whisker

KW - Intrinsic Josephson junction

KW - Small Ag film electrodes

UR - http://www.scopus.com/inward/record.url?scp=0035447219&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035447219&partnerID=8YFLogxK

U2 - 10.1016/S0921-4534(01)00699-2

DO - 10.1016/S0921-4534(01)00699-2

M3 - Article

AN - SCOPUS:0035447219

VL - 362

SP - 333

EP - 337

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

SN - 0921-4534

IS - 1-4

ER -