Electrical modification of a conductive polymer using a scanning probe microscope

Takahito Ono, Shinya Yoshida, Masayoshi Esashi

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)

Abstract

We have demonstrated the electrical modification of a conductive polymer for data storage using a scanning probe microscope (SPM). A blend of polyaniline and polymethyl-methacrylate as the conductive polymer was spun on a silicon substrate to make a test specimen. The tip of a conductive SPM probe was placed in contact with the conductive polymer and electrical modification was carried out by applying a voltage between the SPM probe and the conductive polymer. The conductance image and a simultaneous topographic image were taken with the SPM. It was found that the electrical conductivity was decreased more than 20 times by this modification. Measurement of the topographic image shows no obvious change to the surface topography in the modified area. Measurement of the I-V characteristics suggests that a chemical reaction occurred at an applied voltage of about 3.2 V.

Original languageEnglish
Pages (from-to)1051-1054
Number of pages4
JournalNanotechnology
Volume14
Issue number9
DOIs
Publication statusPublished - 2003 Sep 1

ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

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