Electrical endurance of Co/Ni wire for magnetic domain wall motion device

S. Fukami, M. Yamanouchi, H. Honjo, K. Kinoshita, K. Tokutome, S. Miura, S. Ikeda, N. Kasai, H. Ohno

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

We investigated electrical endurance of perpendicularly magnetized Co/Ni wires, which are a promising candidate material system for current-induced domain wall motion device. Monitoring the wire resistance while applying dc stress is shown to be a promising way to evaluate the electrical breakdown. An electromigration model describes well the observed time-to-failure as a function of temperature and current density. The dc stress current density which leads to 10-yr lifetime with 50% failure at 150 °C was twice as large as the threshold current density for domain wall motion, suggesting that the device with Co/Ni wire is highly durable against electrical stresses.

Original languageEnglish
Article number222410
JournalApplied Physics Letters
Volume102
Issue number22
DOIs
Publication statusPublished - 2013 Jun 3

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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