Electrical endurance of Co/Ni wire for magnetic domain wall motion device

S. Fukami; M. Yamanouchi; H. Honjo; K. Kinoshita; K. Tokutome; S. Miura; S. Ikeda; N. Kasai; H. Ohno

doi:10.1063/1.4809734

Electrical endurance of Co/Ni wire for magnetic domain wall motion device

S. Fukami, M. Yamanouchi, H. Honjo, K. Kinoshita, K. Tokutome, S. Miura, S. Ikeda, N. Kasai, H. Ohno

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

We investigated electrical endurance of perpendicularly magnetized Co/Ni wires, which are a promising candidate material system for current-induced domain wall motion device. Monitoring the wire resistance while applying dc stress is shown to be a promising way to evaluate the electrical breakdown. An electromigration model describes well the observed time-to-failure as a function of temperature and current density. The dc stress current density which leads to 10-yr lifetime with 50% failure at 150 °C was twice as large as the threshold current density for domain wall motion, suggesting that the device with Co/Ni wire is highly durable against electrical stresses.

Original language	English
Article number	222410
Journal	Applied Physics Letters
Volume	102
Issue number	22
DOIs	https://doi.org/10.1063/1.4809734
Publication status	Published - 2013 Jun 3

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.4809734

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title = "Electrical endurance of Co/Ni wire for magnetic domain wall motion device",

abstract = "We investigated electrical endurance of perpendicularly magnetized Co/Ni wires, which are a promising candidate material system for current-induced domain wall motion device. Monitoring the wire resistance while applying dc stress is shown to be a promising way to evaluate the electrical breakdown. An electromigration model describes well the observed time-to-failure as a function of temperature and current density. The dc stress current density which leads to 10-yr lifetime with 50% failure at 150 °C was twice as large as the threshold current density for domain wall motion, suggesting that the device with Co/Ni wire is highly durable against electrical stresses.",

author = "S. Fukami and M. Yamanouchi and H. Honjo and K. Kinoshita and K. Tokutome and S. Miura and S. Ikeda and N. Kasai and H. Ohno",

note = "Funding Information: The authors thank M. Tada of NEC Corporation for fruitful discussion, and I. Morita, T. Hirata, H. Iwanuma, Y. Kawato, M. Murahata, and C. Igarashi for their technical support in device fabrication. This work was supported by the Japan Society for the Promotion of Science (JSPS) through its “Funding Program for World-Leading Innovative R&D on Science and Technology (FIRST Program).” A portion of this work was conducted at TIA-SCR.",

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AU - Fukami, S.

AU - Yamanouchi, M.

AU - Honjo, H.

AU - Kinoshita, K.

AU - Tokutome, K.

AU - Miura, S.

AU - Ikeda, S.

AU - Kasai, N.

AU - Ohno, H.

N1 - Funding Information: The authors thank M. Tada of NEC Corporation for fruitful discussion, and I. Morita, T. Hirata, H. Iwanuma, Y. Kawato, M. Murahata, and C. Igarashi for their technical support in device fabrication. This work was supported by the Japan Society for the Promotion of Science (JSPS) through its “Funding Program for World-Leading Innovative R&D on Science and Technology (FIRST Program).” A portion of this work was conducted at TIA-SCR.

PY - 2013/6/3

Y1 - 2013/6/3

N2 - We investigated electrical endurance of perpendicularly magnetized Co/Ni wires, which are a promising candidate material system for current-induced domain wall motion device. Monitoring the wire resistance while applying dc stress is shown to be a promising way to evaluate the electrical breakdown. An electromigration model describes well the observed time-to-failure as a function of temperature and current density. The dc stress current density which leads to 10-yr lifetime with 50% failure at 150 °C was twice as large as the threshold current density for domain wall motion, suggesting that the device with Co/Ni wire is highly durable against electrical stresses.

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Electrical endurance of Co/Ni wire for magnetic domain wall motion device

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