Electrical analyses of nickel silicide formed on Si nanowires with 10-nm-width

K. Matsumoto, M. Koyama, Y. Wu, K. Kakushima, P. Ahmet, Y. Kataoka, A. Nishiyama, N. Sugii, K. Tsutsui, K. Natori, T. Hattori, H. Iwai

Research output: Contribution to conferencePaper

Fingerprint Dive into the research topics of 'Electrical analyses of nickel silicide formed on Si nanowires with 10-nm-width'. Together they form a unique fingerprint.

Engineering & Materials Science