Electric field thermopower modulation analysis of an interfacial conducting layer formed between Y2O3 and rutile TiO2

Taku Mizuno, Yuki Nagao, Akira Yoshikawa, Kunihito Koumoto, Takeharu Kato, Yuichi Ikuhara, Hiromichi Ohta

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    3 Citations (Scopus)

    Abstract

    Electric field modulation analysis of thermopower (S)-carrier concentration (n) relation of a bilayer laminate structure composed of a 1.5-nm-thick conducting layer, probably TinO2n-1 (n = 2, 3,√ ) Magnéli phase, and rutile TiO2, was performed. The results clearly showed that both the rutile TiO2 and the thin interfacial layer contribute to carrier transport: the rutile TiO2 bulk region (mobility μ ∼ 0.03 cm2 V-1 s-1) and the 1.5-nm-thick interfacial layer (μ ∼ 0.3 cm2 V-1 s-1). The effective thickness of the interfacial layer, which was obtained from the S-n relation, was below ∼3 nm, which agrees well with that of the TEM observation (∼1.5 nm), clearly showing that electric field modulation measurement of S-n relation can effectively clarify the carrier transport properties of a bilayer laminate structure.

    Original languageEnglish
    Article number063719
    JournalJournal of Applied Physics
    Volume110
    Issue number6
    DOIs
    Publication statusPublished - 2011 Sep 15

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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