Electric field thermopower modulation analysis of an interfacial conducting layer formed between Y2O3 and rutile TiO2

Taku Mizuno, Yuki Nagao, Akira Yoshikawa, Kunihito Koumoto, Takeharu Kato, Yuichi Ikuhara, Hiromichi Ohta

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

Electric field modulation analysis of thermopower (S)-carrier concentration (n) relation of a bilayer laminate structure composed of a 1.5-nm-thick conducting layer, probably TinO2n-1 (n = 2, 3,√ ) Magnéli phase, and rutile TiO2, was performed. The results clearly showed that both the rutile TiO2 and the thin interfacial layer contribute to carrier transport: the rutile TiO2 bulk region (mobility μ ∼ 0.03 cm2 V-1 s-1) and the 1.5-nm-thick interfacial layer (μ ∼ 0.3 cm2 V-1 s-1). The effective thickness of the interfacial layer, which was obtained from the S-n relation, was below ∼3 nm, which agrees well with that of the TEM observation (∼1.5 nm), clearly showing that electric field modulation measurement of S-n relation can effectively clarify the carrier transport properties of a bilayer laminate structure.

Original languageEnglish
Article number063719
JournalJournal of Applied Physics
Volume110
Issue number6
DOIs
Publication statusPublished - 2011 Sep 15
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Fingerprint

Dive into the research topics of 'Electric field thermopower modulation analysis of an interfacial conducting layer formed between Y2O3 and rutile TiO2'. Together they form a unique fingerprint.

Cite this